Huawei Li
TitelCiteras avÅr
DeepBurning: automatic generation of FPGA-based learning accelerators for the neural network family
Y Wang, J Xu, Y Han, H Li, X Li
Proceedings of the 53rd Annual Design Automation Conference, 110, 2016
952016
An abacus turn model for time/space-efficient reconfigurable routing
B Fu, Y Han, J Ma, H Li, X Li
Proceeding of the 38th annual international symposium on Computer …, 2011
952011
On topology reconfiguration for defect-tolerant NoC-based homogeneous manycore systems
L Zhang, Y Han, Q Xu, X Li, H Li
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 17 (9 …, 2009
792009
Test resource partitioning based on efficient response compaction for test time and tester channels reduction
YH Han, XW Li, HW Li, A Chandra
Journal of Computer Science and Technology 20 (2), 201-209, 2005
372005
应用 Variable-Tail 编码压缩的测试资源划分方法
韩银和, 李晓维, 徐勇军, 李华伟
电子学报 32 (8), 1346-1350, 2004
37*2004
Zonedefense: A fault-tolerant routing for 2-d meshes without virtual channels
B Fu, Y Han, H Li, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (1), 113-126, 2014
352014
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit
Y Han, Y Hu, X Li, H Li, A Chandra
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 15 (5), 531-540, 2007
352007
A fault criticality evaluation framework of digital systems for error tolerant video applications
Y Fang, H Li, X Li
2011 Asian Test Symposium, 329-334, 2011
332011
Robust test generation for precise crosstalk-induced path delay faults
H Li, P Shen, X Li
VLSI Test Symposium, 2006. Proceedings. 24th IEEE, 6 pp.-305, 2006
332006
SoftPCM: Enhancing energy efficiency and lifetime of phase change memory in video applications via approximate write
Y Fang, H Li, X Li
2012 IEEE 21st Asian Test Symposium, 131-136, 2012
322012
An on-chip clock generation scheme for faster-than-at-speed delay testing
S Pei, H Li, X Li
Proceedings of the Conference on Design, Automation and Test in Europe, 1353 …, 2010
302010
Fault Tolerance Mechanism in Chip Many-Core Processors*
L Zhang, Y Han, H Li, X Li
Tsinghua Science & Technology 12, 169-174, 2007
302007
Automatic Test Program Generation Using Executing-Trace-Based Constraint Extraction for Embedded Processors
Y Zhang, H Li, X Li
IEEE Transactions on Very Large Scale Integration Systems 21 (7), 1220-1233, 2013
282013
nGFSIM: A GPU-Based Fault Simulator for 1-to-n Detection and its Applications
H Li, D Xu, Y Han, KT Cheng, X Li
Test Conference (ITC), 2010 IEEE International, 1-10, 2010
252010
A high-precision on-chip path delay measurement architecture
S Pei, H Li, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (9 …, 2012
242012
Economizing TSV resources in 3-D network-on-chip design
Y Wang, YH Han, L Zhang, BZ Fu, C Liu, HW Li, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (3), 493-506, 2015
232015
A low overhead on-chip path delay measurement circuit
S Pei, H Li, X Li
Asian Test Symposium, 2009. ATS'09., 145-150, 2009
222009
ProPRAM: exploiting the transparent logic resources in non-volatile memory for near data computing
Y Wang, Y Han, L Zhang, H Li, X Li
Proceedings of the 52nd Annual Design Automation Conference, 47, 2015
212015
Path constraint solving based test generation for hard-to-reach states
Y Zhou, T Wang, T Lv, H Li, X Li
2013 22nd Asian Test Symposium, 239-244, 2013
212013
Re-architecting the on-chip memory sub-system of machine-learning accelerator for embedded devices
Y Wang, H Li, X Li
Computer-Aided Design (ICCAD), 2016 IEEE/ACM International Conference on, 1-6, 2016
202016
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Artiklar 1–20