Tathagata De
Tathagata De
Iowa State University, Indian Institute of Technology, United Technologies Corporation
Verifierad e-postadress på carrier.utc.com
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A robust control based solution to the sample‐profile estimation problem in fast atomic force microscopy
S M. Salapaka, T De, A Sebastian
International Journal of Robust and Nonlinear Control: IFAC‐Affiliated …, 2005
492005
Construction and experimental implementation of a model-based inverse filter to attenuate hysteresis in ferroelectric transducers
AG Hatch, RC Smith, T De, MV Salapaka
IEEE Transactions on Control Systems Technology 14 (6), 1058-1069, 2006
412006
Sample-profile estimate for fast atomic force microscopy
S Salapaka, T De, A Sebastian
Applied Physics Letters 87 (5), 053112, 2005
38*2005
Model development and inverse compensator design for high speed nanopositioning
RC Smith, MV Salapaka, A Hatch, J Smith, T De
Proceedings of the 41st IEEE Conference on Decision and Control, 2002. 4 …, 2002
382002
Model development for atomic force microscope stage mechanisms
RC Smith, AG Hatch, T De, MV Salapaka, RCH Del Rosario, JK Raye
SIAM Journal on Applied Mathematics 66 (6), 1998-2026, 2006
212006
Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy
P Agarwal, T De, MV Salapaka
Review of Scientific Instruments 80 (10), 103701, 2009
182009
Real-time detection of probe loss in atomic force microscopy
T De, P Agarwal, DR Sahoo, MV Salapaka
Applied Physics Letters 89 (13), 133119, 2006
182006
Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope
T De, AM Chettoor, P Agarwal, MV Salapaka, S Nettikadan
Ultramicroscopy 110 (3), 254-258, 2010
112010
Model development and control design for high-speed atomic force microscopy
AG Hatch, RC Smith, T De
Smart Structures and Materials 2004: Modeling, Signal Processing, and …, 2004
112004
Model development for piezoceramic nanopositioners
RC Smith, A Hatch, T De
42nd IEEE International Conference on Decision and Control (IEEE Cat. No …, 2003
102003
Experimental implementation of a model-based inverse filter to attenuate hysteresis in an atomic force microscope
AG Hatch, RC Smith, T De
2004 43rd IEEE Conference on Decision and Control (CDC)(IEEE Cat. No …, 2004
52004
Real time detection of loss of cantilever sensing loss
MV Salapaka, T De, P Agarwal, DR Sahoo
US Patent 7,313,948, 2008
42008
Micro-manipulation using combined optical tweezers and atomic force microscope
H Sehgal, T De, S Nettikadan, MV Salapaka
Optical Trapping and Optical Micromanipulation IV 6644, 66441L, 2007
42007
Chiller motor control system
T De
US Patent 9,825,574, 2017
22017
New approaches for sample-profile estimation for fast atomic force microscopy
SM Salapaka, T De, A Sebastian
ASME International Mechanical Engineering Congress and Exposition 42169 …, 2005
22005
Dual-compressor refrigeration unit
TJ Ludwig, T De
US Patent 10,760,840, 2020
2020
Expansion valve control
T De
US Patent 10,704,814, 2020
2020
Centrifugal compressor startup control
T De
US Patent 10,544,791, 2020
2020
System and method of freeze protection for a chiller
T De, A Vecchiotti
US Patent App. 15/760,964, 2018
2018
HVAC motor load balancing
T De
US Patent 9,528,718, 2016
2016
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Artiklar 1–20