| A statistical study of de-embedding applied to eye diagram analysis PD Hale, J Jargon, CMJ Wang, B Grossman, M Claudius, JL Torres, ... IEEE Transactions on Instrumentation and Measurement 61 (2), 475-488, 2011 | 147 | 2011 |
| Multiport VNA measurement TG Ruttan, B Grossman, A Ferrero, V Teppati, J Martens IEEE Microwave Magazine 9 (3), 56-69, 2008 | 48 | 2008 |
| Microwave multiport measurements for the digital world A Ferrero, V Teppati, E Fledell, B Grossman, T Ruttan IEEE Microwave Magazine 12 (1), 61-73, 2011 | 19 | 2011 |
| Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths AM Detofsky, CS Nnebe, BD Grossman US Patent 9,059,803, 2015 | 15 | 2015 |
| Uncertainty in multiport S-parameters measurements A Ferrero, M Garelli, B Grossman, S Choon, V Teppati 77th ARFTG Microwave Measurement Conference, 1-4, 2011 | 14 | 2011 |
| Increasing current carrying capability through direct liquid cooling of test contacts WS Crippen, B Grossman, RE Swart, P Tadayon US Patent 9,360,502, 2016 | 7 | 2016 |
| A Statistical Study of De-Embedding Applied to Eye Diagram Analysis" published in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT PD Hale, J Jargon, CMJ Wang, B Grossman, M Claudius, JL Torres, ... VOL, 0 | 6 | |
| A process to reduce reproducibility error in VNA measurements JM Peterson, B Grossman 2010 76th ARFTG Microwave Measurement Conference, 1-5, 2010 | 5 | 2010 |
| PCB manufacturing variation impact on high frequency measurement fixtures E Fledell, B Grossman 2010 76th ARFTG Microwave Measurement Conference, 1-6, 2010 | 5 | 2010 |
| Comparison of multi-port VNA architectures—Measured results T Ruttan, B Grossman, E Fledell 2006 68th ARFTG Conference: Microwave Measurement, 1-7, 2006 | 5 | 2006 |
| PCB Manufacturability and Reliability Solutions for Fine Pitch PCB Server Boards A Caputo, WC Roth, B Grossman, B Aspnes, X Ye, W Acevedo, ... IPC/APEX, 2020 | 1 | 2020 |
| Evaluating the Recess Depths of Recess-in-Motherboards using Different Metrologies A Caputo, T Swettlen, JT Harris, R Aspandiar, B Grossman, S Mokler Proceedings of the IPC APEX Conference, San Diego, California, 2019 | 1 | 2019 |
| Cavity Board SMT Assembly Challenges D Amir, B Grossman SMTA International 2018, 2018 | 1 | 2018 |
| Multiport VNA measurement uncertainty-Signal integrity applications B Grossman, M Peterson, J Torres 2011 IEEE International Symposium on Electromagnetic Compatibility, 619-623, 2011 | 1 | 2011 |
| Technique for assessing PNA measurement repeatability using a NIST standard N Akil, B Grossman 2005 66th ARFTG Microwave Measurement Conference (ARFTG), 1-6, 2005 | 1 | 2005 |
| Integrated circuit supports with microstrips X Ye, P Tadayon, W Wenzhi, SR Aravamudhan, NS Tan, BD Grossman US Patent App. 18/260,805, 2024 | | 2024 |
| PCB Solution with Partial Plane-on-Outer-Layer (POOL) Stackup Y Ren, J Hsu, B Grossman, G Brist 2023 18th International Microsystems, Packaging, Assembly and Circuits …, 2023 | | 2023 |
| Integrated circuit testing architecture AM Detofsky, BD Grossman, J Pan, JM Peterson, RK Minemier US Patent 9,506,980, 2016 | | 2016 |
| ARFTG June 2013 L Hayden, B Grossman, PH Aaen IEEE Microwave Magazine 14 (3), 58-59, 2013 | | 2013 |
| Workshops and short courses B Grossman, E Fledell, K Redmond IEEE Microwave Magazine 14 (3), 30-46, 2013 | | 2013 |
