| Best practices for compact modeling in Verilog-A CC McAndrew, GJ Coram, KK Gullapalli, JR Jones, LW Nagel, AS Roy, ... IEEE Journal of the Electron Devices Society 3 (5), 383-396, 2015 | 111 | 2015 |
| Efficient statistical BJT modeling, why/spl beta/is more than I/sub c//I/sub b CC McAndrew, J Bates, RT Ida, P Drennan Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting, 28-31, 1997 | 46 | 1997 |
| Quadratic backward propagation of variance for nonlinear statistical circuit modeling I Stevanovic, CC McAndrew IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009 | 33 | 2009 |
| Compact device modeling using Verilog-AMS and ADMS L Lemaitre, W Grabiński, C McAndrew Electron Technology: Internet Journal 35 (3), 1-5, 2003 | 18 | 2003 |
| Corner models: Inaccurate at best, and it only gets worst… CC McAndrew, IS Lim, B Braswell, D Garrity Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 1-4, 2013 | 15 | 2013 |
| A physically-based behavioral snapback model R Ida, CC McAndrew Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, 1-5, 2012 | 15 | 2012 |
| Advances in ldmos compact modeling for ic design: The sp-hv model and its capabilities CC McAndrew, A Lorenzo-Cassagnes, P Goyhenetche, J Pigott, W Yao, ... IEEE Solid-State Circuits Magazine 6 (2), 35-46, 2014 | 9 | 2014 |
| Unified flicker noise model C McAndrew Operation and Modeling of the MOS Transistor, 2011 | 5 | 2011 |
| Operation and Modeling of the MOS Transistor Yannis P.. Tsividis, C McAndrew Oxford University Press, 2011 | 5 | 2011 |
| Proximity Effect Modeling C McAndrew Freescale Semiconductor, 2011 | 4 | 2011 |
| MOFSET mismatch characterization circuit CC Mcandrew, MJ Zunino US Patent 8,729,954, 2014 | 3 | 2014 |
| A self-amplifying four-transistor MOSFET mismatch test structure CC McAndrew, M Zunino, B Braswell IEEE transactions on semiconductor manufacturing 26 (3), 273-280, 2013 | 3 | 2013 |
| MOFSET mismatch characterization circuit CC Mcandrew, B Braswell US Patent 9,111,894, 2015 | 2 | 2015 |
| Complete and consistent all-region body-referenced capacitance model based on symmetric linearization C McAndrew Oxford University Press, 2011 | 2 | 2011 |
| Improved parameter extraction procedure for PSP-based MOS varactor model Z Zhu, J Victory, S Chaudhry, L Dong, Z Yan, J Zheng, W Wu, X Li, Q Zhou, ... 2009 IEEE International Conference on Microelectronic Test Structures, 148-153, 2009 | 2 | 2009 |
| Self-biasing and self-amplifying MOSFET mismatch test structure CC McAndrew, M Zunino, B Braswell 2012 IEEE International Conference on Microelectronic Test Structures, 219-224, 2012 | 1 | 2012 |
| Textbooks Are Top Sellers at ISSCC for Second Year [Conference Reports] K Olstein IEEE Solid-State Circuits Magazine 3 (2), 95-98, 2011 | 1 | 2011 |
| Complete and consistent all-region body-referenced DC and charge models based on symmetric linearization C McAndrew Oxford University Press, 2011 | 1 | 2011 |
| Bjt small-signal equivalent circuit representation CC McAndrew, LW Nagel 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 153-156, 2010 | 1 | 2010 |
| Session 9—Advanced simulation techniques C McAndrew, L Nagel 2015 IEEE Custom Integrated Circuits Conference (CICC), 1-1, 2015 | | 2015 |
