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Jongchol Kim
Jongchol Kim
Principal engineer of CAE team, Samsung Electronics
Verifierad e-postadress på samsung.com
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Semiconductor device
KK Bhuwalka, SJ Kim, JC Kim, H Kim
US Patent 10,217,816, 2019
612019
Universality of short-channel effects on ultrascaled MOSFET performance
MA Pourghaderi, AT Pham, H Ilatikhameneh, J Kim, HH Park, S Jin, ...
IEEE Electron Device Letters 39 (2), 168-171, 2017
182017
Multi-domain compact modeling for GeSbTe-based memory and selector devices and simulation for large-scale 3-D cross-point memory arrays
N Xu, J Wang, Y Deng, Y Lu, B Fu, W Choi, U Monga, J Jeon, J Kim, ...
2016 IEEE International Electron Devices Meeting (IEDM), 7.7. 1-7.7. 4, 2016
182016
Comprehensive simulation study of direct source-to-drain tunneling in ultra-scaled Si, Ge, and III-V DG-FETs
Z Jiang, J Wang, HH Park, AT Pham, N Xu, Y Lu, S Jin, W Choi, ...
IEEE Transactions on Electron Devices 64 (3), 945-952, 2017
132017
Layout-induced stress effects on the performance and variation of FinFETs
C Lee, HC Kang, JG Min, J Kim, U Kwon, KH Lee, Y Park
2015 International Conference on Simulation of Semiconductor Processes and …, 2015
72015
Performance evaluation of FinFETs: from multisubband BTE to DD calibration
S Jin, AT Pham, W Choi, MA Pourghaderi, J Kim, KH Lee
2016 International Conference on Simulation of Semiconductor Processes and …, 2016
62016
Semiconductor device
SH Song, YS Kim, KB Chang, UH Kwon, YH Kim, JC Kim, CW Jeong
US Patent 10,504,894, 2019
52019
Band-to-band tunneling in SiGe: Influence of alloy scattering
S Jin, HH Park, M Luisier, W Choi, J Kim, KH Lee
IEEE Electron Device Letters 38 (4), 422-425, 2017
52017
Circuit design method and simulation method based on process variation caused by aging
JW Jeon, JH Choi, YH Kim, KH Lee, U Kwon, JC Kim
US Patent App. 15/251,411, 2017
42017
Impact of BTBT, stress and interface charge on optimum Ge in SiGe pMOS for low power applications
S Dhar, HK Noh, SJ Kim, HW Kim, Z Wu, WS Lee, KK Bhuwalka, JC Kim, ...
2016 International Conference on Simulation of Semiconductor Processes and …, 2016
42016
An effective algorithm for numerical Schrödinger solver of quantum well structures
J Kim, CY Chen, RW Dutton
Journal of Computational Electronics 7, 1-5, 2008
32008
Circuit design method and simulation method based on random telegraph signal noise
JW Jeon, HE Park, KH Lee, U Kwon, JC Kim
US Patent 10,311,187, 2019
22019
Nanoscale-nMOSFET junction design: Quantum transport approach
MA Pourghaderi, C Park, J Kim, C Jeong, WY Chung, KH Lee, HH Park, ...
2017 International Conference on Simulation of Semiconductor Processes and …, 2017
22017
On the efficient methods to solve multi-subband BTE in 1D gas systems: Decoupling approximations versus the accurate approach
AT Pham, Z Jiang, S Jin, J Wang, W Choi, MA Pourghaderi, J Kim, KH Lee
2016 International Conference on Simulation of Semiconductor Processes and …, 2016
22016
A new weight redistribution technique for electron-electron scattering in the MC simulation
J Kim, H Shin, C Lee, YJ Park, HS Min
IEEE transactions on electron devices 51 (9), 1448-1454, 2004
22004
Atomistic simulation of band-to-band tunneling in SiGe: Influence of alloy scattering
HH Park, S Jin, W Choi, M Luisier, J Kim, KH Lee
2017 International Conference on Simulation of Semiconductor Processes and …, 2017
12017
Semiconductor device and method of fabricating the same
S Son, D Bae, J Kim, SC Paek
US Patent App. 12/955,084, 2011
12011
Lateral Ge/SiGe/Si hetero-channel p-type MOSFETs
CY Chen, Y Liu, J Kim, RW Dutton
2009 International Conference on Simulation of Semiconductor Processes and …, 2009
2009
A Simple Technique for the Monte Carlo Simulation of Transport in Quantum Wells
J Kim, CY Chen, RW Dutton
Simulation of Semiconductor Processes and Devices 2007: SISPAD 2007, 77-80, 2007
2007
Nonlocal transport and thermal noise of the nanoscale MOSFET
YJ Park, S Jin, S Hong, HS Min
Noise in Devices and Circuits II 5470, 74-83, 2004
2004
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Artiklar 1–20