| An optimal vector-network-analyzer calibration algorithm DF Williams, JCM Wang, U Arz IEEE Transactions on Microwave Theory and Techniques 51 (12), 2391-2401, 2003 | 160 | 2003 |
| An optimal multiline TRL calibration algorithm DF Williams, CM Wang, U Arz IEEE MTT-S International Microwave Symposium Digest, 2003 3, 1819-1822, 2003 | 112 | 2003 |
| Accurate characteristic impedance measurement on silicon DF Williams, U Arz, H Grabinski 1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 98CH36192 …, 1998 | 89 | 1998 |
| Crosstalk corrections for coplanar-waveguide scattering-parameter calibrations DF Williams, FJ Schmückle, R Doerner, GN Phung, U Arz, W Heinrich IEEE transactions on microwave theory and techniques 62 (8), 1748-1761, 2014 | 68 | 2014 |
| Characteristic-impedance measurement error on lossy substrates DF Williams, U Arz, H Grabinski IEEE microwave and wireless components letters 11 (7), 299-301, 2001 | 65 | 2001 |
| Radiation, multimode propagation, and substrate modes in W-band CPW calibrations FJ Schmückle, R Doerner, GN Phung, W Heinrich, D Williams, U Arz 2011 41st European Microwave Conference, 297-300, 2011 | 44 | 2011 |
| Influence of microwave probes on calibrated on-wafer measurements GN Phung, FJ Schmückle, R Doerner, B Kähne, T Fritzsch, U Arz, ... IEEE Transactions on Microwave Theory and Techniques 67 (5), 1892-1900, 2019 | 35 | 2019 |
| Applying the calibration comparison technique for verification of transmission line standards on silicon up to 110 GHz A Rumiantsev, PL Corson, SL Sweeney, U Arz 2009 73rd ARFTG Microwave Measurement Conference, 1-6, 2009 | 32* | 2009 |
| 110 GHz on-wafer measurement comparison on alumina substrate T Probst, R Doerner, M Ohlrogge, R Lozar, U Arz 90th. ARFTG Dig., 1-4, 2017 | 29 | 2017 |
| Traceable coplanar waveguide calibrations on fused silica substrates up to 110 GHz U Arz, K Kuhlmann, T Dziomba, G Hechtfischer, GN Phung, FJ Schmückle, ... IEEE Transactions on Microwave Theory and Techniques 67 (6), 2423-2432, 2019 | 28 | 2019 |
| Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations J Leinhos, U Arz 2008 71st ARFTG Microwave Measurement Conference, 1-4, 2008 | 27 | 2008 |
| Asymmetric coupled CMOS lines-an experimental study U Arz, DF William, DK Walker, H Grabinski IEEE Transactions on Microwave Theory and Techniques 48 (12), 2409-2414, 2000 | 25 | 2000 |
| Causal characteristic impedance of planar transmission lines DF Williams, BK Alpert, U Arz, DK Walker, H Grabinski IEEE transactions on advanced packaging 26 (2), 165-171, 2003 | 23 | 2003 |
| Mutual interference in calibration line configurations FJ Schmückle, T Probst, U Arz, GN Phung, R Doerner, W Heinrich 2017 89th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2017 | 22 | 2017 |
| Adaptive estimation of complex calibration residual errors of wafer-level S-parameters measurement system AA Savin, VG Guba, A Rumiantsev, BD Maxson, D Schubert, U Arz 84th ARFTG Microwave Measurement Conference, 1-4, 2014 | 21 | 2014 |
| In-phase/quadrature covariance-matrix representation of the uncertainty of vectors and complex numbers DF Williams, CM Wang, U Arz 2006 68th ARFTG Conference: Microwave Measurement, 1-4, 2006 | 21 | 2006 |
| Calibrated waveform measurement with high-impedance probes P Kabos, HC Reader, U Arz, DF Williams IEEE transactions on microwave theory and techniques 51 (2), 530-535, 2003 | 19 | 2003 |
| Wideband frequency-domain characterization of high-impedance probes U Arz, HC Reader, P Kabos, DF Williams 58th ARFTG Conference Digest 40, 1-7, 2001 | 18 | 2001 |
| Effects degrading accuracy of CPW mTRL calibration at W band GN Phung, FJ Schmückle, R Doerner, W Heinrich, T Probst, U Arz 2018 IEEE/MTT-S International Microwave Symposium-IMS, 1296-1299, 2018 | 17 | 2018 |
| Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines U Arz, H Grabinski, DF Williams 54th ARFTG Conference Digest 36, 65-70, 1999 | 17 | 1999 |
