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### Co-authors

- Thomas RunklerProfessor of Computer Science, Siemens AG, Technische Universität MünchenVerified email at siemens.com
- Alexander HansVerified email at ahans.de
- Stefan DepewegSiemens AGVerified email at uos.de
- José Miguel Hernández-LobatoAssociate Professor in Machine Learning, University of CambridgeVerified email at cam.ac.uk
- Finale Doshi-VelezProfessor, HarvardVerified email at seas.harvard.edu
- Daniel HeinResearch Scientist, Siemens AGVerified email at siemens.com
- Thomas MartinetzProfessor of Computer Science, University of LübeckVerified email at inb.uni-luebeck.de
- Sigurd SpieckermannSiemens Corporate TechnologyVerified email at alumni.stanford.edu
- Michel TokicSiemens AG, MunichVerified email at tokic.com
- Bruce DenbySorbonne UniversitéVerified email at ieee.org
- Prévotet Jean-ChristopheIETR Insa de RennesVerified email at insa-rennes.fr
- Bertrand GranadoSobonne universitéVerified email at upmc.fr
- Phillip SwazinnaPhD Student, Technical University of MunichVerified email at tum.de
- Eric MoreauProfessor in Electrical Engineering, University of PoitiersVerified email at univ-poitiers.fr