| Towards an ADC BIST scheme using the histogram test technique F Azaïs, S Bernard, Y Betrand, M Renovell Proceedings IEEE European Test Workshop, 53-58, 2000 | 110 | 2000 |
| Implementation of a linear histogram BIST for ADCs F Azaïs, S Bernard, Y Bertrand, M Renovell Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001 | 106 | 2001 |
| Hardware resource minimization for histogram-based ADC BIST M Renovell, F Azaïs, S Bernard, Y Bertrand Proceedings 18th IEEE VLSI Test Symposium, 247-252, 2000 | 91 | 2000 |
| A low-cost adaptive ramp generator for analog BIST applications F Azaïs, S Bernard, Y Bertrand, X Michel, M Renovell Proceedings 19th IEEE VLSI Test Symposium. VTS 2001, 266-271, 2001 | 88 | 2001 |
| A high accuracy triangle-wave signal generator for on-chip ADC testing S Bernard, F Azaïs, Y Bertrand, M Renovell Proceedings The Seventh IEEE European Test Workshop, 89-94, 2002 | 80 | 2002 |
| A low-cost BIST architecture for linear histogram testing of ADCs F Azaïs, S Bernard, Y Bertrand, M Renovell Journal of Electronic Testing 17 (2), 139-147, 2001 | 44 | 2001 |
| Making predictive analog/RF alternate test strategy independent of training set size H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell 2012 IEEE International Test Conference, 1-9, 2012 | 38 | 2012 |
| DC-100-GHz frequency doublers in InP DHBT technology V Puyal, A Konczykowska, P Nouet, S Bernard, S Blayac, F Jorge, M Riet, ... IEEE Transactions on Microwave theory and techniques 53 (4), 1338-1344, 2005 | 37 | 2005 |
| Smart selection of indirect parameters for DC-based alternate RF IC testing H Ayari, F Azais, S Bernard, M Comte, M Renovell, V Kerzerho, O Potin, ... 2012 IEEE 30th VLSI Test Symposium (VTS), 19-24, 2012 | 36 | 2012 |
| Device for distributing power between cathodes of a multipolar electrode, in particular of an implant D Andreu, S Bernard, Y Bertrand, G Catheras, J Galy, D Guiraud, ... US Patent 7,768,151, 2010 | 33 | 2010 |
| A new methodology for ADC test flow optimization S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell International Test Conference, 201-209, 2003 | 27 | 2003 |
| New implantable stimulator for the FES of paralyzed muscles JD Techer, S Bernard, Y Bertrand, G Cathébras, D Guiraud Proceedings of the 30th European Solid-State Circuits Conference, 455-458, 2004 | 24 | 2004 |
| Efficient on-chip generator for linear histogram BIST of ADCs S Bernard, F Azais, Y Bertrand, M Renovell Proc. International Mixed-Signal Testing Workshop, 89-96, 2001 | 20 | 2001 |
| A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell IEEE Design & Test of Computers 23 (3), 234-243, 2006 | 19 | 2006 |
| Optimizing sinusoidal histogram test for low cost ADC BIST F Azaïs, S Bernard, Y Bertrand, M Renovell Journal of Electronic Testing 17 (3-4), 255-266, 2001 | 19 | 2001 |
| Fast digital post-processing technique for integral nonlinearity correction of analog-to-digital converters: Validation on a 12-bit folding-and-interpolating analog-to-digital … V Kerzérho, V Fresnaud, D Dallet, S Bernard, L Bossuet IEEE Transactions on Instrumentation and Measurement 60 (3), 768-775, 2010 | 18 | 2010 |
| Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies S Larguech, F Azaïs, S Bernard, M Comte, V Kerzérho, M Renovell Microelectronics Journal 46 (11), 1091-1102, 2015 | 17 | 2015 |
| A broad-band active frequency doubler operating up to 120 GHz V Puyal, A Konczykowska, P Nouet, S Bernard, M Riet, F Jorge, J Godin European Gallium Arsenide and Other Semiconductor Application Symposium …, 2005 | 16 | 2005 |
| Analog BIST generator for ADC testing S Bernard, F Azaïs, Y Bertrand, M Renovell Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance …, 2001 | 16 | 2001 |
| A passive pressure sensor for continuously measuring the intraocular pressure in glaucomatous patients P Auvray, L Rousseau, G Lissorgues, F Soulier, O Potin, S Bernard, ... IRBM 33 (2), 117-122, 2012 | 15 | 2012 |
Mariane ComteLIRMM, Université de MontpellierVerifierad e-postadress på umontpellier.fr
