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Co-authors
Ridong ZhangHong Kong University of Science and TechnologyVerified email at ust.hk
Chunhui ZhaoZhejiang UniversityVerified email at zju.edu.cn
Yuan YaoProfessor, Department of Chemical Engineering, National Tsing Hua UniversityVerified email at mx.nthu.edu.tw
Limin WangHainan Normal UniversityVerified email at hainnu.edu.cn
Liu TaoProfessor, Dalian University of Technology, ChinaVerified email at dlut.edu.cn
Zhixing CaoProfessor at East China University of Science and TechnologyVerified email at g.harvard.edu
Jingyi LuHong Kong University of Science and TechnologyVerified email at ust.hk
Song ZhihuanProfessor of Control Science & Engineering, Zhejiang UniversityVerified email at zju.edu.cn
Zhiqiang GeProfessor of Automation, Zhejiang UniversityVerified email at zju.edu.cn
Youqing WangBeijing University of Chemical TechnologyVerified email at mail.buct.edu.cn
Xiaopeng TANGThe Hong Kong University of Science and TechnologyVerified email at connect.ust.hk
Yu-Chu TianProfessor of Computer Science, Queensland University of TechnologyVerified email at ieee.org
YAN QINResearch Fellow, Singapore University of Technology and DesignVerified email at sutd.edu.sg
Li DeweiShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
Changfu ZouAssistant Professor in Electrical Engineering, Chalmers University of TechnologyVerified email at chalmers.se
Li YuZhejiang University of TechnologyVerified email at zjut.edu.cn
Francis DoyleHarvard UniversityVerified email at seas.harvard.edu
Frank AllgöwerUniversity of StuttgartVerified email at ist.uni-stuttgart.de
Tao ChenUniversity of SurreyVerified email at surrey.ac.uk
Furong Gao
Verified email at ust.hk