M. Salapaka
TitelCiteras avÅr
High bandwidth nano-positioner: A robust control approach
S Salapaka, A Sebastian, JP Cleveland, MV Salapaka
Review of scientific instruments 73 (9), 3232-3241, 2002
4442002
Controllability of molecular systems
V Ramakrishna, MV Salapaka, M Dahleh, H Rabitz, A Peirce
Physical Review A 51 (2), 960, 1995
4371995
Dynamical analysis and control of microcantilevers
M Ashhab, MV Salapaka, M Dahleh, I Mezić
Automatica 35 (10), 1663-1670, 1999
2351999
Scanning probe microscopy
SM Salapaka, MV Salapaka
IEEE Control Systems Magazine 28 (2), 65-83, 2008
2282008
Structured optimal and robust control with multiple criteria: A convex solution
X Qi, MV Salapaka, PG Voulgaris, M Khammash
IEEE Transactions on Automatic Control 49 (10), 1623-1640, 2004
1892004
Multi-mode noise analysis of cantilevers for scanning probe microscopy
MV Salapaka, HS Bergh, J Lai, A Majumdar, E McFarland
Journal of Applied Physics 81 (6), 2480-2487, 1997
1841997
Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy
M Ashhab, MV Salapaka, M Dahleh, I Mezić
Nonlinear Dynamics 20 (3), 197-220, 1999
1701999
A practical approach to operating survivable WDM networks
M Sridharan, MV Salapaka, AK Somani
IEEE journal on selected areas in communications 20 (1), 34-46, 2002
1362002
Harmonic and power balance tools for tapping-mode atomic force microscope
A Sebastian, MV Salapaka, DJ Chen, JP Cleveland
Journal of Applied Physics 89 (11), 6473-6480, 2001
1282001
On the problem of reconstructing an unknown topology via locality properties of the Wiener filter
D Materassi, MV Salapaka
IEEE transactions on automatic control 57 (7), 1765-1777, 2012
1152012
Piezoelectric scanners for atomic force microscopes: Design of lateral sensors, identification and control
A Daniele, S Salapaka, MV Salapaka, M Dahleh
Proceedings of the 1999 American Control Conference (Cat. No. 99CH36251) 1 …, 1999
981999
Linearity of amplitude and phase in tapping-mode atomic force microscopy
MV Salapaka, DJ Chen, JP Cleveland
Physical Review B 61 (2), 1106, 2000
862000
Transient-signal-based sample-detection in atomic force microscopy
DR Sahoo, A Sebastian, MV Salapaka
Applied Physics Letters 83 (26), 5521-5523, 2003
752003
A review of the systems approach to the analysis of dynamic-mode atomic force microscopy
A Sebastian, A Gannepalli, MV Salapaka
IEEE Transactions on Control Systems Technology 15 (5), 952-959, 2007
632007
Approaches for capacity and revenue optimization in survivable WDM networks
M Sridharan, AK Somani, MV Salapaka
Journal of High Speed Networks 10 (2), 109-125, 2001
632001
Robust synthesis in/sub 1: a globally optimal solution
M Khammash, MV Salapaka, T Van Voorhis
IEEE Transactions on Automatic Control 46 (11), 1744-1754, 2001
61*2001
Distributed protocol for determining when averaging consensus is reached
V Yadav, MV Salapaka
45th Annual Allerton Conf, 715-720, 2007
572007
Model development for atomic force microscope stage mechanisms
RC Smith, AG Hatch, T De, MV Salapaka, RCH Del Rosario, JK Raye
SIAM Journal on Applied Mathematics 66 (6), 1998-2026, 2006
57*2006
Harmonic analysis based modeling of tapping-mode AFM
A Sebastian, MV Salapaka, DJ Chen, JP Cleveland
Proceedings of the 1999 American Control Conference (Cat. No. 99CH36251) 1 …, 1999
541999
Thermally driven non-contact atomic force microscopy
A Gannepalli, A Sebastian, J Cleveland, M Salapaka
Applied Physics Letters 87 (11), 111901, 2005
522005
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Artiklar 1–20