| A phase diagram for polymer-grafted nanoparticles in homopolymer matrices D Sunday, J Ilavsky, DL Green Macromolecules 45 (9), 4007-4011, 2012 | 172 | 2012 |
| Xi-cam: a versatile interface for data visualization and analysis RJ Pandolfi, DB Allan, E Arenholz, L Barroso-Luque, SI Campbell, ... Journal of synchrotron radiation 25 (4), 1261-1270, 2018 | 121 | 2018 |
| Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library JS Villarrubia, AE Vladár, B Ming, RJ Kline, DF Sunday, JS Chawla, S List Ultramicroscopy 154, 15-28, 2015 | 113 | 2015 |
| Determining the shape and periodicity of nanostructures using small-angle x-ray scattering DF Sunday, S List, JS Chawla, RJ Kline Journal of Applied Crystallography 48 (5), 1355-1363, 2015 | 79 | 2015 |
| Determination of the internal morphology of nanostructures patterned by directed self assembly DF Sunday, MR Hammond, C Wang, W Wu, DM Delongchamp, M Tjio, ... ACS nano 8 (8), 8426-8437, 2014 | 70 | 2014 |
| Impact of ATRP initiator spacer length on grafting poly (methyl methacrylate) from silica nanoparticles C Huang, T Tassone, K Woodberry, D Sunday, DL Green Langmuir 25 (23), 13351-13360, 2009 | 63 | 2009 |
| Thermal and rheological behavior of polymer grafted nanoparticles DF Sunday, DL Green Macromolecules 48 (23), 8651-8659, 2015 | 55 | 2015 |
| Three-dimensional x-ray metrology for block copolymer lithography line-space patterns DF Sunday, MR Hammond, C Wang, W Wu, RJ Kline, GE Stein Journal of Micro/Nanolithography, MEMS, and MOEMS 12 (3), 031103-031103, 2013 | 49 | 2013 |
| Self-Assembly of ABC bottlebrush Triblock Terpolymers with evidence for Looped backbone conformations DF Sunday, AB Chang, CD Liman, E Gann, DM Delongchamp, ... Macromolecules 51 (18), 7178-7185, 2018 | 48 | 2018 |
| Impact of initiator spacer length on grafting polystyrene from silica nanoparticles D Sunday, S Curras-Medina, DL Green Macromolecules 43 (11), 4871-4878, 2010 | 48 | 2010 |
| Reducing block copolymer interfacial widths through polymer additives DF Sunday, RJ Kline Macromolecules 48 (3), 679-686, 2015 | 42 | 2015 |
| Derivation of multiple covarying material and process parameters using physics-based modeling of X-ray data G Khaira, M Doxastakis, A Bowen, J Ren, HS Suh, T Segal-Peretz, ... Macromolecules 50 (19), 7783-7793, 2017 | 35 | 2017 |
| Template–polymer commensurability and directed self‐assembly block copolymer lithography DF Sunday, E Ashley, L Wan, KC Patel, R Ruiz, RJ Kline Journal of Polymer Science Part B: Polymer Physics 53 (8), 595-603, 2015 | 34 | 2015 |
| Characterizing the Interface Scaling of High χ Block Copolymers near the Order–Disorder Transition DF Sunday, MJ Maher, AF Hannon, CD Liman, S Tein, G Blachut, ... Macromolecules 51 (1), 173-180, 2018 | 33 | 2018 |
| X-ray scattering critical dimensional metrology using a compact x-ray source for next generation semiconductor devices RJ Kline, DF Sunday, D Windover, BD Bunday Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (1), 014001-014001, 2017 | 29 | 2017 |
| Advancing x-ray scattering metrology using inverse genetic algorithms AF Hannon, DF Sunday, D Windover, R Joseph Kline Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (3), 034001-034001, 2016 | 27 | 2016 |
| Intercomparison between optical and x-ray scatterometry measurements of FinFET structures P Lemaillet, TA Germer, RJ Kline, DF Sunday, C Wang, W Wu Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013 | 27 | 2013 |
| Concentration Dependence of the Size and Symmetry of a Bottlebrush Polymer in a Good Solvent DF Sunday, A Chremos, TB Martin, AB Chang, AB Burns, RH Grubbs Macromolecules 53 (16), 7132-7140, 2020 | 26 | 2020 |
| Critical dimension small angle X-ray scattering measurements of FinFET and 3D memory structures C Settens, B Bunday, B Thiel, RJ Kline, D Sunday, C Wang, W Wu, ... Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013 | 24 | 2013 |
| Evaluation of the effect of data quality on the profile uncertainty of critical dimension small angle x-ray scattering DF Sunday, S List, JS Chawla, R Joseph Kline Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (1), 014001-014001, 2016 | 22 | 2016 |
