| Room to high temperature measurements of flexible SOI FinFETs with sub-20-nm fins A Diab, GAT Sevilla, S Cristoloveanu, MM Hussain IEEE Transactions on Electron Devices 61 (12), 3978-3984, 2014 | 30 | 2014 |
| Characterization of heavily doped SOI wafers under pseudo-MOSFET configuration FY Liu, A Diab, I Ionica, K Akarvardar, C Hobbs, T Ouisse, X Mescot, ... Solid-state electronics 90, 65-72, 2013 | 21 | 2013 |
| The pseudo-MOSFET: Principles and recent trends S Cristoloveanu, I Ionica, A Diab, F Liu ECS Transactions 50 (5), 249, 2013 | 19 | 2013 |
| A new characterization technique for SOI wafers: Split C (V) in pseudo-MOSFET configuration A Diab, C Fernández, A Ohata, N Rodriguez, I Ionica, Y Bae, ... Solid-state electronics 90, 127-133, 2013 | 18 | 2013 |
| Low-frequency noise in SOI pseudo-MOSFET with pressure probes AEH Diab, I Ionica, S Cristoloveanu, F Allibert, YH Bae, JA Chroboczek, ... Microelectronic engineering 88 (7), 1283-1285, 2011 | 16 | 2011 |
| Model for Frequency Dependence of SplitMeasurements on Bare SOI Wafers A Diab, I Ionica, G Ghibaudo, S Cristoloveanu IEEE electron device letters 34 (6), 792-794, 2013 | 12 | 2013 |
| Split-capacitance and conductance-frequency characteristics of SOI wafers in pseudo-MOSFET configuration L Pirro, A Diab, I Ionica, G Ghibaudo, L Faraone, S Cristoloveanu IEEE Transactions on Electron Devices 62 (9), 2717-2723, 2015 | 10 | 2015 |
| High temperature study of flexible silicon-on-insulator fin field-effect transistors A Diab, GA Torres Sevilla, MT Ghoneim, MM Hussain Applied Physics Letters 105 (13), 2014 | 8 | 2014 |
| Gold nanoparticles detection using intrinsic SOI-based sensor I Ionica, AEH Diab, S Cristoloveanu 2011 11th IEEE International Conference on Nanotechnology, 38-43, 2011 | 8 | 2011 |
| Determination of effective capacitance area for pseudo-mosfet based characterization of bare soi wafers by split-c (V) measurements C Fernandez, N Rodriguez, A Ohata, A Diab, F Gamiz, S Cristoloveanu ECS Transactions 53 (5), 209, 2013 | 7 | 2013 |
| Photo-pseudo-metal–oxide–semiconductor field effect transistor for characterization of surface recombination in silicon on insulator materials M Daanoune, A Diab, S Sirajeddine, A Kaminski-Cachopo, I Ionica, ... Journal of Applied Physics 113 (18), 2013 | 6 | 2013 |
| Low-temperature pseudo-metal-oxide-semiconductor field-effect transistor measurements on bare silicon-on-insulator wafers A Diab, L Pirro, I Ionica, X Mescot, G Ghibaudo, S Cristoloveanu Applied Physics Letters 101 (9), 2012 | 5 | 2012 |
| Impact of gate impedance on dielectric breakdown evaluation for 28 nm FDSOI transistors A Diab, X Garros, M Rafik, X Federspiel, E Vincent, G Reimbold Microelectronic Engineering 178, 21-25, 2017 | 2 | 2017 |
| Effective mobility in extra-thin film and ultra-thin BOX SOI wafers. A Diab, C Fernández, L Pirro, N Rodriguez, I Ionica, A Ohata, YH Bae, ... EuroSOI 2013, 2.4, 2013 | 2 | 2013 |
| Impact of effective capacitance area on the characterization of SOI wafers by split-c (v) in pseudo-MOSFET configuration C Fernandez, A Diab, N Rodriguez, A Ohata, F Allibert, I Ionica, F Gamiz, ... 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG), 123-126, 2012 | 2 | 2012 |
| Electrical characterization of ultra-thin silicon-on-insulator substrates: static and split CV measurements in the pseudo-MOSFET configuration L Pirro, A Diab, I Ionica, G Ghibaudo, S Cristoloveanu ECS Transactions 54 (1), 203, 2013 | 1 | 2013 |
| Static and low-frequency noise characterization of ultrathin SOI with very thin BOX in pseudo-MOSFET configuration A Diab, I Ionica, S Cristoloveanua, F Allibert, YH Bae, JA Chroboczek, ... 2011 International Semiconductor Device Research Symposium (ISDRS), 1-2, 2011 | 1 | 2011 |
| A selection of SOI puzzles and tentative answers S Cristoloveanu, M Bawedin, KI Na, W Van Den Daele, KH Park, ... Semiconductor-On-Insulator Materials for Nanoelectronics Applications, 425-441, 2011 | 1 | 2011 |
| Advances in the pseudo-MOSFET characterization method I Ionica, AEH Diab, YH Bae, X Mescot, A Ohata, F Allibert, S Cristoloveanu CAS 2010 Proceedings (International Semiconductor Conference) 1, 45-51, 2010 | 1 | 2010 |
| Présentation du GIP-CNFM-CIME Nanotech A Aitoumeri Abdelhamid Aitoumeri, 2023 | | 2023 |
Gerard GhibaudoIMEP-LAHC, Minatec-INP GrenobleVerified email at minatec.inpg.fr
