| Direct comparison of the quantized Hall resistance in gallium arsenide and silicon A Hartland, K Jones, JM Williams, BL Gallagher, T Galloway Physical review letters 66 (8), 969, 1991 | 127 | 1991 |
| Synthesis of precision waveforms using a SINIS Josephson junction array R Behr, JM Williams, P Patel, TJBM Janssen, T Funck, M Klonz IEEE transactions on instrumentation and measurement 54 (2), 612-615, 2005 | 100 | 2005 |
| Graphene, universality of the quantum Hall effect and redefinition of the SI system T Janssen, NE Fletcher, R Goebel, JM Williams, A Tzalenchuk, ... New Journal of Physics 13 (9), 093026, 2011 | 94 | 2011 |
| Operation of graphene quantum Hall resistance standard in a cryogen-free table-top system T Janssen, S Rozhko, I Antonov, A Tzalenchuk, JM Williams, Z Melhem, ... 2D Materials 2 (3), 035015, 2015 | 85 | 2015 |
| Precision comparison of the quantum Hall effect in graphene and gallium arsenide T Janssen, JM Williams, NE Fletcher, R Goebel, A Tzalenchuk, ... Metrologia 49 (3), 294, 2012 | 82 | 2012 |
| Modernizing the SI: towards an improved, accessible and enduring system MJT Milton, JM Williams, SJ Bennett Metrologia 44 (5), 356, 2007 | 60 | 2007 |
| The simulation and measurement of the response of Josephson junctions to optoelectronically generated short pulses JM Williams, T Janssen, L Palafox, DA Humphreys, R Behr, J Kohlmann, ... Superconductor Science and Technology 17 (6), 815, 2004 | 56 | 2004 |
| An automated cryogenic current comparator resistance ratio bridge JM Williams, A Hartland Conference on Precision Electromagnetic Measurements, 348-349, 1990 | 56 | 1990 |
| A simple resistance network for calibrating resistance bridges DR White, K Jones, JM Williams, IE Ramsey IEEE Transactions on Instrumentation and Measurement 46 (5), 1068-1074, 1997 | 53 | 1997 |
| Development of a 60 Hz power standard using SNS programmable Josephson voltage standards CJ Burroughs, SP Benz, PD Dresselhaus, BC Waltrip, TL Nelson, ... IEEE Transactions on instrumentation and measurement 56 (2), 289-294, 2007 | 52 | 2007 |
| Characterization of a high-resolution analog-to-digital converter with a Josephson AC voltage source WG Kurten, E Mohns, R Behr, JM Williams, P Patel, G Ramm, H Bachmair IEEE transactions on instrumentation and measurement 54 (2), 649-652, 2005 | 49 | 2005 |
| Cryogenic current comparators and their application to electrical metrology JM Williams IET science, measurement & technology 5 (6), 211-224, 2011 | 43 | 2011 |
| An automated cryogenic current comparator resistance ratio bridge for routine resistance measurements JM Williams, T Janssen, G Rietveld, E Houtzager Metrologia 47 (3), 167, 2010 | 41 | 2010 |
| Quantum-referenced voltage waveform synthesiser JM Williams, D Henderson, J Pickering, R Behr, F Müller, ... IET science, measurement & technology 5 (5), 163-174, 2011 | 37 | 2011 |
| The quantum metrology triangle and the redefinition of the SI ampere and kilogram; analysis of a reduced set of observational equations MJT Milton, JM Williams, AB Forbes Metrologia 47 (3), 279, 2010 | 37 | 2010 |
| New capability for generating and measuring small DC currents at NPL NE Fletcher, SP Giblin, JM Williams, KJ Lines IEEE Transactions on Instrumentation and Measurement 56 (2), 326-330, 2007 | 37 | 2007 |
| Capturing complex behavior in Josephson traveling-wave parametric amplifiers T Dixon, JW Dunstan, GB Long, JM Williams, PJ Meeson, CD Shelly Physical Review Applied 14 (3), 034058, 2020 | 36 | 2020 |
| Achieving sub-100-ns switching of programmable Josephson arrays JM Williams, D Henderson, P Patel, R Behr, L Palafox IEEE Transactions on Instrumentation and Measurement 56 (2), 651-654, 2007 | 36 | 2007 |
| Realization of a quantum standard for AC voltage: Overview of a European research project OA Chevtchenko, HE van den Brom, E Houtzager, R Behr, J Kohlmann, ... IEEE transactions on instrumentation and measurement 54 (2), 628-631, 2005 | 32 | 2005 |
| Investigation of binary Josephson arrays for arbitrary waveform synthesis P Kleinschmidt, PD Patel, JM Williams, T Janssen IEE Proceedings-Science, Measurement and Technology 149 (6), 313-316, 2002 | 32 | 2002 |
Luis PalafoxPTBVerified email at ptb.de
