| Testing microelectronic biofluidic systems HG Kerkhoff IEEE Design & Test of Computers 24 (1), 72-82, 2007 | 74 | 2007 |
| Testability analysis of analog systems GJ Hemink, BW Meijer, HG Kerkhoff IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1990 | 63 | 1990 |
| Multiple-valued logic charge-coupled devices Kerkhoff, Tervoert IEEE Transactions on computers 100 (9), 644-652, 1981 | 63 | 1981 |
| Current-mode CMOS high-radix circuits SP Onnewee Proc, 16th Int. Symp, on Multiple-Valued Logic, 1986, 60-69, 1986 | 60 | 1986 |
| Testable design and testing of micro-electro-fluidic arrays HG Kerkhoff, M Acar Proceedings. 21st VLSI Test Symposium, 2003., 403-409, 2003 | 57 | 2003 |
| Fault modeling and fault simulation in mixed micro-fluidic microelectronic systems HG Kerkhoff, HPA Hendriks Journal of electronic testing 17, 427-437, 2001 | 46 | 2001 |
| Multiple-valued CCD circuits JT Butler, HG Kerkhoff Computer 21 (4), 58-69, 1988 | 39 | 1988 |
| Structural computer-aided design of current-mode CMOS logic circuits S Onneweer, H Kerkhoff, JT Butler Proc. of 18th Int. Symp. on Multiple-Valued Logic, 21-30, 1988 | 37 | 1988 |
| Synchronous full-scan for asynchronous handshake circuits F Te Beest, A Peeters, K Van Berkel, H Kerkhoff Journal of Electronic Testing 19, 397-406, 2003 | 35 | 2003 |
| Design and implementation of a hierarchical testable architecture using the boundary scan standard RP Van Riessen, HG Kerkhoff, A Kloppenburg 1st European Test Conference, 1989, 1989 | 35 | 1989 |
| Automatic scan insertion and test generation for asynchronous circuits FT Beest, A Peeters, M Verra, K van Berkel, H Kerkhoff Proceedings. International Test Conference, 804-813, 2002 | 34 | 2002 |
| High-radix current-mode CMOS circuits based on the truncated-difference operator SP Onneweer, HG Kerkhoff Proc. 17th ISMVL, 188-195, 1987 | 34 | 1987 |
| Tackling test trade-offs from design, manufacturing to market using economic modeling EH Volkerink, A Khoche, LA Kamas, J Rivoir, HG Kerkhoff Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 1098-1107, 2001 | 30 | 2001 |
| Exploiting multiple mahalanobis distance metrics to screen outliers from analog product manufacturing test responses S Krishnan, HG Kerkhoff IEEE Design & Test 30 (3), 18-24, 2013 | 29 | 2013 |
| Design of a high-radix programmable logic array using profiled peristaltic charge-coupled devices HG Kerkhoff, JT Butler Proceedings of the 16th international symposium on multiple-valued logic …, 1986 | 29 | 1986 |
| Integration of the scan-test method into an architecture specific core-test approach C Feige, JT Pierick, C Wouters, R Tangelder, HG Kerkhoff Journal of Electronic Testing 14, 125-131, 1999 | 26 | 1999 |
| Analysis and design of an on-chip retargeting engine for IEEE 1687 networks A Ibrahim, HG Kerkhoff 2016 21th IEEE European Test Symposium (ETS), 1-6, 2016 | 25 | 2016 |
| A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing Y Zhao, HG Kerkhoff 2016 International Conference on Design and Technology of Integrated Systems …, 2016 | 25 | 2016 |
| Testing philosophy behind the micro analysis system HG Kerkhoff Design, Test, and Microfabrication of MEMS and MOEMS 3680, 78-83, 1999 | 24 | 1999 |
| Design of an infrastructural IP dependability manager for a dependable reconfigurable many-core processor HG Kerkhoff, X Zhang 2010 Fifth IEEE International Symposium on Electronic Design, Test …, 2010 | 23 | 2010 |
