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- Takao SomeyaProfessor, Department of Electric and Electronic Engineering, The University of TokyoVerified email at ee.t.u-tokyo.ac.jp
- Tomoyuki YokotaUniversity of TokyoVerified email at ntech.t.u-tokyo.ac.jp
- Mitsuru TakenakaThe University of TokyoVerified email at mosfet.t.u-tokyo.ac.jp
- Shinichi TakagiThe University of TokyoVerified email at ee.t.u-tokyo.ac.jp
- Sanghyeon Kim, S. Kim, S.-H. Kim, S....KAIST, Korea Institute of Science and Technology (KIST), imec, The University of TokyoVerified email at kaist.ac.kr
- Hanbit JinETRIVerified email at etri.re.kr
- Naoji MatsuhisaAssociate Professor, Research Center for Advanced Science and Technology, The University of TokyoVerified email at iis.u-tokyo.ac.jp
- Yan Wang (王 燕)Guangdong Technion, Israel Institute of Technology; The University of Tokyo; Monash University (PhD)Verified email at technion.ac.il
- Kenjiro FukudaThin-Film Device Laboratory, RIKENVerified email at riken.go.jp
- Amir ReuvenyCornell TechVerified email at cornell.edu
- Takuya HoshiiTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- Ryosho NakaneThe University of TokyoVerified email at cryst.t.u-tokyo.ac.jp
- Robert NawrockiAssistant Professor, Purdue UniversityVerified email at purdue.edu
- Wonryung LeeKorea Institute of Science and Technology (KIST)Verified email at kist.re.kr
- Sungjun ParkElectrical and Computer Engineering, Ajou UniversityVerified email at ajou.ac.kr
- Hyunjae LeeStaff Engineer, Material Development Team, Samsung Semiconductor R&D Center