Pranav Agarwal
Pranav Agarwal
GE Global Research
Verifierad e-postadress på umn.edu
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Compact surface potential model for FD SOI MOSFET considering substrate depletion region
P Agarwal, G Saraswat, MJ Kumar
IEEE Transactions on Electron Devices 55 (3), 789-795, 2008
262008
Real time estimation of equivalent cantilever parameters in tapping mode atomic force microscopy
P Agarwal, MV Salapaka
Applied Physics Letters 95 (8), 083113, 2009
222009
Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy
P Agarwal, T De, MV Salapaka
Review of Scientific Instruments 80 (10), 103701, 2009
182009
Transient force atomic force microscopy: A new nano-interrogation method
DR Sahoo, P Agarwal, MV Salapaka
2007 American Control Conference, 2135-2140, 2007
182007
Real-time detection of probe loss in atomic force microscopy
T De, P Agarwal, DR Sahoo, MV Salapaka
Applied Physics Letters 89 (13), 133119, 2006
182006
Maximum-likelihood sequence detector for dynamic mode high density probe storage
N Kumar, P Agarwal, A Ramamoorthy, MV Salapaka
IEEE Transactions on Communications 58 (6), 1686-1694, 2010
132010
Real-time probe based quantitative determination of material properties at the nanoscale
G Saraswat, P Agarwal, G Haugstad, MV Salapaka
Nanotechnology 24 (26), 265706, 2013
112013
Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope
T De, AM Chettoor, P Agarwal, MV Salapaka, S Nettikadan
Ultramicroscopy 110 (3), 254-258, 2010
112010
Modeling and identification of the dynamics of electrostatically actuated microcantilever with integrated thermal sensor
P Agarwal, D Sahoo, A Sebastian, H Pozidis, MV Salapaka
2008 47th IEEE Conference on Decision and Control, 2624-2630, 2008
102008
Real-time models of electrostatically actuated cantilever probes with integrated thermal sensor for nanoscale interrogation
P Agarwal, DR Sahoo, A Sebastian, H Pozidis, MV Salapaka
Journal of microelectromechanical systems 19 (1), 83-98, 2009
72009
Multimode and multitone analysis of the dynamic mode operation of the Atomic Force Microscope
G Saraswat, P Agarwal, MV Salapaka
2013 American Control Conference, 5506-5511, 2013
52013
Channel modeling and detector design for dynamic mode high density probe storage
N Kumar, P Agarwal, A Ramamoorthy, MV Salapaka
2008 42nd Annual Conference on Information Sciences and Systems, 1273-1278, 2008
52008
Control and systems approaches to atomic force microscopy
P Agarwal, MV Salapaka
IFAC Proceedings Volumes 41 (2), 10456-10467, 2008
42008
Real time detection of loss of cantilever sensing loss
MV Salapaka, T De, P Agarwal, DR Sahoo
US Patent 7,313,948, 2008
42008
High-speed nano-imaging using dynamic mode AFM: A MAP detection approach
N Kumar, G Saraswat, P Agarwal, A Ramamoorthy, M Salapaka
2010 Conference Record of the Forty Fourth Asilomar Conference on Signals …, 2010
32010
Model mismatch paradigm for probe based nanoscale imaging.
P Agarwal
22010
Automated level set segmentation of the trabecular centrum in healthy and metastatic vertebrae
P Agarwal, M Hardisty, T Skrinskas, CM Whyne
Symposium on Comp Methods in Orthopaedic Biomechanics, 2006
22006
Real time estimation of equivalent cantilever parameters in tapping mode atomic force microscopy (vol 95, 083113, 2009)
P Agarwal, MV Salapaka
APPLIED PHYSICS LETTERS 100 (15), 2012
2012
Channel Modeling and Detector Design for Dynamic Mode High Density Probe Storage and Nano-imaging Applications
N Kumar, P Agarwal, A Ramamoorthy, M Salapaka
IFAC Proceedings Volumes 44 (1), 2024-2029, 2011
2011
Real-time detection and reduction of probe-loss in atomic force microscopy
P Agarwal, M Salapaka
APS, H36. 004, 2008
2008
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Artiklar 1–20