| The" millipede"-nanotechnology entering data storage P Vettiger, G Cross, M Despont, U Drechsler, U Durig, B Gotsmann, ... IEEE Transactions on nanotechnology 1 (1), 39-55, 2002 | 950 | 2002 |
| Quantitative measurement of short-range chemical bonding forces MA Lantz, HJ Hug, R Hoffmann, PJA Van Schendel, P Kappenberger, ... Science 291 (5513), 2580-2583, 2001 | 452 | 2001 |
| Millipede-a MEMS-based scanning-probe data-storage system E Eleftheriou, T Antonakopoulos, GK Binnig, G Cherubini, M Despont, ... IEEE transactions on magnetics 39 (2), 938-945, 2003 | 312 | 2003 |
| Atomic-force-microscope study of contact area and friction on NbSe 2 MA Lantz, SJ O'shea, ME Welland, KL Johnson Physical Review B 55 (16), 10776, 1997 | 279 | 1997 |
| Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon H Bhaskaran, B Gotsmann, A Sebastian, U Drechsler, MA Lantz, ... Nature nanotechnology 5 (3), 181, 2010 | 206 | 2010 |
| Atomistic wear in a single asperity sliding contact B Gotsmann, MA Lantz Physical review letters 101 (12), 125501, 2008 | 203 | 2008 |
| Lateral stiffness of the tip and tip-sample contact in frictional force microscopy MA Lantz, SJ O’shea, ACF Hoole, ME Welland Applied physics letters 70 (8), 970-972, 1997 | 184 | 1997 |
| Probe-based ultrahigh-density storage technology A Pantazi, A Sebastian, TA Antonakopoulos, P Bächtold, AR Bonaccio, ... IBM Journal of Research and Development 52 (4.5), 493-511, 2008 | 142 | 2008 |
| Low Temperature Scanning Force Microscopy of the Surface MA Lantz, HJ Hug, PJA Van Schendel, R Hoffmann, S Martin, A Baratoff, ... Physical Review Letters 84 (12), 2642, 2000 | 133 | 2000 |
| Dynamic superlubricity and the elimination of wear on the nanoscale MA Lantz, D Wiesmann, B Gotsmann Nature nanotechnology 4 (9), 586-591, 2009 | 108 | 2009 |
| Quantized thermal transport across contacts of rough surfaces B Gotsmann, MA Lantz Nature materials 12 (1), 59-65, 2013 | 107 | 2013 |
| 29.5- Recording Areal Density on Barium Ferrite Tape G Cherubini, RD Cideciyan, L Dellmann, E Eleftheriou, W Haeberle, ... IEEE transactions on magnetics 47 (1), 137-147, 2010 | 107 | 2010 |
| A micromechanical thermal displacement sensor with nanometre resolution MA Lantz, GK Binnig, M Despont, U Drechsler Nanotechnology 16 (8), 1089, 2005 | 105 | 2005 |
| Simultaneous force and conduction measurements in atomic force microscopy MA Lantz, SJ O’shea, ME Welland Physical Review B 56 (23), 15345, 1997 | 105 | 1997 |
| A vibration resistant nanopositioner for mobile parallel-probe storage applications MA Lantz, HE Rothuizen, U Drechsler, W Haberle, M Despont Journal of Microelectromechanical Systems 16 (1), 130-139, 2007 | 103 | 2007 |
| On the application of transition state theory to atomic-scale wear TDB Jacobs, B Gotsmann, MA Lantz, RW Carpick Tribology Letters 39 (3), 257-271, 2010 | 89 | 2010 |
| High density timing based servo format for use with tilted transducer arrays RG Biskeborn, MA Lantz US Patent 9,019,653, 2015 | 87 | 2015 |
| Control of MEMS-based scanning-probe data-storage devices A Pantazi, A Sebastian, G Cherubini, M Lantz, H Pozidis, H Rothuizen, ... IEEE Transactions on Control Systems Technology 15 (5), 824-841, 2007 | 86 | 2007 |
| High resolution vacuum scanning thermal microscopy of and M Hinz, O Marti, B Gotsmann, MA Lantz, U Dürig Applied Physics Letters 92 (4), 043122, 2008 | 85 | 2008 |
| Dynamic force microscopy in fluid M Lantz, YZ Liu, XD Cui, H Tokumoto, SM Lindsay Surface and Interface Analysis 27 (5‐6), 354-360, 1999 | 85 | 1999 |
Giovanni CherubiniResearch Staff Member, IBM Research - ZurichVerifierad e-postadress på zurich.ibm.com
