| Effects of total-ionizing-dose irradiation on SEU-and SET-induced soft errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, YN Liu, ... IEEE Transactions on Nuclear Science 64 (1), 471-476, 2016 | 16 | 2016 |
| Single-event multiple transients in conventional and guard-ring hardened inverter chains under pulsed laser and heavy-ion irradiation R Chen, F Zhang, W Chen, L Ding, X Guo, C Shen, Y Luo, W Zhao, ... IEEE Transactions on Nuclear Science 64 (9), 2511-2518, 2017 | 12 | 2017 |
| Effects of temperature and supply voltage on SEU-and SET-induced errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, ... IEEE Transactions on Nuclear Science 64 (8), 2122-2128, 2017 | 9 | 2017 |
| Investigation of Pt-salt-doped-standalone-multiwall carbon nanotubes for on-chip interconnect applications J Liang, R Chen, R Ramos, J Lee, H Okuno, D Kalita, V Georgiev, ... IEEE Transactions on Electron Devices 66 (5), 2346-2352, 2019 | 8 | 2019 |
| Modeling the dependence of single-event transients on strike location for circuit-level simulation L Ding, W Chen, T Wang, R Chen, Y Luo, F Zhang, X Pan, H Sun, L Chen IEEE Transactions on Nuclear Science 66 (6), 866-874, 2019 | 7 | 2019 |
| Progress on carbon nanotube BEOL interconnects B Uhlig, J Liang, J Lee, R Ramos, A Dhavamani, N Nagy, J Dijon, ... 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 937-942, 2018 | 7 | 2018 |
| Study of total-ionizing-dose effects on a single-event-hardened phase-locked loop Z Chen, D Ding, Y Dong, Y Shan, S Zhou, Y Hu, Y Zheng, C Peng, ... IEEE Transactions on Nuclear Science 65 (4), 997-1004, 2018 | 7 | 2018 |
| Impact of temporal masking of flip-flop upsets on soft error rates of sequential circuits RM Chen, NN Mahatme, ZJ Diggins, L Wang, EX Zhang, YP Chen, YN Liu, ... IEEE Transactions on Nuclear Science 64 (8), 2098-2106, 2017 | 7 | 2017 |
| Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances--Part II: Impact of Charge Transfer Doping R Chen, J Liang, J Lee, VP Georgiev, R Ramos, H Okuno, D Kalita, ... IEEE Transactions on Electron Devices 65 (11), 4963-4970, 2018 | 6 | 2018 |
| Variability study of MWCNT local interconnects considering defects and contact resistances—Part I: pristine MWCNT R Chen, J Liang, J Lee, VP Georgiev, R Ramos, H Okuno, D Kalita, ... IEEE Transactions on Electron Devices 65 (11), 4955-4962, 2018 | 5 | 2018 |
| Improved on-chip self-triggered single-event transient measurement circuit design and applications R Chen, W Chen, X Guo, C Shen, F Zhang, L Zheng, W Zhao, L Ding, ... Microelectronics Reliability 71, 99-105, 2017 | 5 | 2017 |
| Single-event multiple transients in guard-ring hardened inverter chains of different layout designs W Zhao, C He, W Chen, R Chen*, P Cong, F Zhang, Z Wang, C Shen, ... Microelectronics Reliability 87, 151-157, 2018 | 4 | 2018 |
| Research progress of radiation effects mechanisms and experimental techniques in nano-devices W Chen, J Liu, X Ma, G Guo, Y Zhao, X Guo, Y Luo, Z Yao, L Ding, ... Chinese Science Bulletin 63 (13), 1211-1222, 2018 | 4 | 2018 |
| Analysis of temporal masking effect on single-event upset rates for sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, YN Liu, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 4 | 2016 |
| Development of high power transient electromagnetic field sensors Y Chao, M Cui, C Rongmei, L Xin 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 215-218, 2015 | 4 | 2015 |
| Challenges and progress on carbon nanotube integration for beol interconnects B Uhlig, A Dhavamani, N Nagy, K Lilienthal, R Liske, R Ramos, J Dijon, ... 2018 IEEE International Interconnect Technology Conference (IITC), 16-18, 2018 | 3 | 2018 |
| Atomistic-to circuit-level modeling of doped SWCNT for on-chip interconnects J Liang, J Lee, S Berrada, VP Georgiev, R Pandey, R Chen, A Asenov, ... IEEE Transactions on Nanotechnology 17 (6), 1084-1088, 2018 | 3 | 2018 |
| Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model L Ding, W Chen, H Guo, T Wang, R Chen, Y Luo, F Zhang, X Pan Microelectronics Reliability 81, 337-341, 2018 | 2 | 2018 |
| Effects of temperature and supply voltage on SEU-and SET-induced single-event errors in bulk 40-nm sequential circuits RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, YN Liu, ... 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 1 | 2016 |
| Total ionizing dose sensitivity of a radiation-tolerant phase-locked loop in a 130 nm SOI technology Z Chen, M Lin, D Ding, Y Zheng, Z Sang, S Zou, R Chen 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 1 | 2016 |
Bharat BhuvaVanderbilt UniversityVerified email at vanderbilt.edu
