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Saqib Ali Khan
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Evolution of random access process: From Legacy networks to 5G and beyond
WT Toor, A Basit, N Maroof, SA Khan, M Saadi
Transactions on Emerging Telecommunications Technologies 33 (6), e3776, 2022
172022
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation
SA Khan, C Lim, G Bak, S Baeg, S Lee
Microelectronics Reliability 69, 100-108, 2017
52017
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation
SA Khan, SJ Wen, S Baeg
IEICE Electronics Express 13 (17), 20160627-20160627, 2016
52016
A Novel Dissimilarity of Activity Biomarker and Functional Connectivity Analysis for the Epilepsy Diagnosis
AAK Abdul Basit, Saqib Ali Khan, Waqas Tariq Toor, Naeem Maroof, Muhammad Saadi
Symmetry 11 (8), 979, 2019
22019
Reversible encryption and lossless data hiding for medical imaging aiding smart health care
A Basit, WT Toor, M Saadi, N Maroof, SA Khan, SA Otaibi
Cluster Computing 26 (5), 2977-2991, 2023
12023
Evaluation of Neutron Radiation Impact for 1200V class 4H-SiC MOSFET at Gate Switching Mode with TCAD Simulation
Y Bae, Dongwoo and Kim, Kiseog and Lee, Hyeokjae and Chung, Sung S. and Kih ...
IEEE Transactions on Nuclear Science, 2023
2023
A semiconductor device radiation test method, and a semiconductor device radiation test system
SS Kim Young Boo, Chung Sung Soo, Kih Joongsik, Kim Ki Seog, Lee Hyeokjae ...
KR Patent 10-2,418,633, 2022
2022
A semiconductor device inspection method, a semiconductor device radiation test system, a test beam evaluation method, and a test beam evaluation system using reference …
Kim Young Boo, Chung Sung Soo, Kih Joongsik, Kim Ki Seog, Lee Hyeokjae, Kim ...
KR Patent 10-2,418,634, 2022
2022
Architectural design tradeoffs in SRAM-based TCAMs
A Ahmed, K Park, SA Khan, N Maroof, S Baeg
IEICE Electronics Express 16 (13), 20190267-20190267, 2019
2019
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