Q. Peter He
Q. Peter He
Department of Chemical Engineering, Auburn University
Verified email at auburn.edu
Title
Cited by
Cited by
Year
Fault detection using the k-nearest neighbor rule for semiconductor manufacturing processes
QP He, J Wang
IEEE transactions on semiconductor manufacturing 20 (4), 345-354, 2007
3752007
A study of effects of multicollinearity in the multivariable analysis
W Yoo, R Mayberry, S Bae, K Singh, QP He, JW Lillard Jr
International journal of applied science and technology 4 (5), 9, 2014
3122014
A new fault diagnosis method using fault directions in Fisher discriminant analysis
QP He, SJ Qin, J Wang
AIChE journal 51 (2), 555-571, 2005
2592005
A curve fitting method for detecting valve stiction in oscillating control loops
QP He, J Wang, M Pottmann, SJ Qin
Industrial & engineering chemistry research 46 (13), 4549-4560, 2007
1702007
Multivariate statistical process monitoring based on statistics pattern analysis
J Wang, QP He
Industrial & Engineering Chemistry Research 49 (17), 7858-7869, 2010
1322010
Statistics pattern analysis: A new process monitoring framework and its application to semiconductor batch processes
QP He, J Wang
AIChE journal 57 (1), 107-121, 2011
1242011
Statistical process monitoring as a big data analytics tool for smart manufacturing
QP He, J Wang
Journal of Process Control 67, 35-43, 2018
852018
A reduced order soft sensor approach and its application to a continuous digester
HJ Galicia, QP He, J Wang
Journal of Process Control 21 (4), 489-500, 2011
732011
Large-scale semiconductor process fault detection using a fast pattern recognition-based method
QP He, J Wang
IEEE Transactions on Semiconductor Manufacturing 23 (2), 194-200, 2010
702010
Recursive least squares estimation for run-to-run control with metrology delay and its application to STI etch process
J Wang, QP He, SJ Qin, CA Bode, MA Purdy
IEEE Transactions on Semiconductor Manufacturing 18 (2), 309-319, 2005
702005
Comparison of variable selection methods for PLS-based soft sensor modeling
ZX Wang, QP He, J Wang
Journal of Process Control 26, 56-72, 2015
642015
Principal component based k-nearest-neighbor rule for semiconductor process fault detection
QP He, J Wang
2008 American Control Conference, 1606-1611, 2008
642008
Nuclear Kaiso indicates aggressive prostate cancers and promotes migration and invasiveness of prostate cancer cells
J Jones, H Wang, J Zhou, S Hardy, T Turner, D Austin, Q He, A Wells, ...
The American journal of pathology 181 (5), 1836-1846, 2012
612012
Comparison of the performance of a reduced-order dynamic PLS soft sensor with different updating schemes for digester control
HJ Galicia, QP He, J Wang
Control Engineering Practice 20 (8), 747-760, 2012
462012
Clinical and biological significance of KISS1 expression in prostate cancer
H Wang, J Jones, T Turner, QP He, S Hardy, WE Grizzle, DR Welch, ...
The American journal of pathology 180 (3), 1170-1178, 2012
422012
Kaiso, a transcriptional repressor, promotes cell migration and invasion of prostate cancer cells through regulation of miR-31 expression
H Wang, W Liu, SN Black, O Turner, JM Daniel, W Dean-Colomb, QP He, ...
Oncotarget 7 (5), 5677, 2016
382016
Differential expression of breast cancer-associated genes between stage-and age-matched tumor specimens from African-and Caucasian-American Women diagnosed with breast cancer
JM Grunda, AD Steg, Q He, MR Steciuk, S Byan-Parker, MR Johnson, ...
BMC research notes 5 (1), 248, 2012
362012
State estimation in high-mix semiconductor manufacturing
J Wang, QP He, TF Edgar
Journal of Process Control 19 (3), 443-456, 2009
352009
A bayesian approach for disturbance detection and classification and its application to state estimation in run-to-run control
J Wang, QP He
IEEE Transactions on semiconductor manufacturing 20 (2), 126-136, 2007
312007
Run-to-run control and state estimation in high-mix semiconductor manufacturing
CA Bode, J Wang, QP He, TF Edgar
Annual Reviews in Control 31 (2), 241-253, 2007
312007
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