| Fault detection using the k-nearest neighbor rule for semiconductor manufacturing processes QP He, J Wang IEEE transactions on semiconductor manufacturing 20 (4), 345-354, 2007 | 375 | 2007 |
| A study of effects of multicollinearity in the multivariable analysis W Yoo, R Mayberry, S Bae, K Singh, QP He, JW Lillard Jr International journal of applied science and technology 4 (5), 9, 2014 | 312 | 2014 |
| A new fault diagnosis method using fault directions in Fisher discriminant analysis QP He, SJ Qin, J Wang AIChE journal 51 (2), 555-571, 2005 | 259 | 2005 |
| A curve fitting method for detecting valve stiction in oscillating control loops QP He, J Wang, M Pottmann, SJ Qin Industrial & engineering chemistry research 46 (13), 4549-4560, 2007 | 170 | 2007 |
| Multivariate statistical process monitoring based on statistics pattern analysis J Wang, QP He Industrial & Engineering Chemistry Research 49 (17), 7858-7869, 2010 | 132 | 2010 |
| Statistics pattern analysis: A new process monitoring framework and its application to semiconductor batch processes QP He, J Wang AIChE journal 57 (1), 107-121, 2011 | 124 | 2011 |
| Statistical process monitoring as a big data analytics tool for smart manufacturing QP He, J Wang Journal of Process Control 67, 35-43, 2018 | 85 | 2018 |
| A reduced order soft sensor approach and its application to a continuous digester HJ Galicia, QP He, J Wang Journal of Process Control 21 (4), 489-500, 2011 | 73 | 2011 |
| Large-scale semiconductor process fault detection using a fast pattern recognition-based method QP He, J Wang IEEE Transactions on Semiconductor Manufacturing 23 (2), 194-200, 2010 | 70 | 2010 |
| Recursive least squares estimation for run-to-run control with metrology delay and its application to STI etch process J Wang, QP He, SJ Qin, CA Bode, MA Purdy IEEE Transactions on Semiconductor Manufacturing 18 (2), 309-319, 2005 | 70 | 2005 |
| Comparison of variable selection methods for PLS-based soft sensor modeling ZX Wang, QP He, J Wang Journal of Process Control 26, 56-72, 2015 | 64 | 2015 |
| Principal component based k-nearest-neighbor rule for semiconductor process fault detection QP He, J Wang 2008 American Control Conference, 1606-1611, 2008 | 64 | 2008 |
| Nuclear Kaiso indicates aggressive prostate cancers and promotes migration and invasiveness of prostate cancer cells J Jones, H Wang, J Zhou, S Hardy, T Turner, D Austin, Q He, A Wells, ... The American journal of pathology 181 (5), 1836-1846, 2012 | 61 | 2012 |
| Comparison of the performance of a reduced-order dynamic PLS soft sensor with different updating schemes for digester control HJ Galicia, QP He, J Wang Control Engineering Practice 20 (8), 747-760, 2012 | 46 | 2012 |
| Clinical and biological significance of KISS1 expression in prostate cancer H Wang, J Jones, T Turner, QP He, S Hardy, WE Grizzle, DR Welch, ... The American journal of pathology 180 (3), 1170-1178, 2012 | 42 | 2012 |
| Kaiso, a transcriptional repressor, promotes cell migration and invasion of prostate cancer cells through regulation of miR-31 expression H Wang, W Liu, SN Black, O Turner, JM Daniel, W Dean-Colomb, QP He, ... Oncotarget 7 (5), 5677, 2016 | 38 | 2016 |
| Differential expression of breast cancer-associated genes between stage-and age-matched tumor specimens from African-and Caucasian-American Women diagnosed with breast cancer JM Grunda, AD Steg, Q He, MR Steciuk, S Byan-Parker, MR Johnson, ... BMC research notes 5 (1), 248, 2012 | 36 | 2012 |
| State estimation in high-mix semiconductor manufacturing J Wang, QP He, TF Edgar Journal of Process Control 19 (3), 443-456, 2009 | 35 | 2009 |
| A bayesian approach for disturbance detection and classification and its application to state estimation in run-to-run control J Wang, QP He IEEE Transactions on semiconductor manufacturing 20 (2), 126-136, 2007 | 31 | 2007 |
| Run-to-run control and state estimation in high-mix semiconductor manufacturing CA Bode, J Wang, QP He, TF Edgar Annual Reviews in Control 31 (2), 241-253, 2007 | 31 | 2007 |
