Kristian Wiklund
TitleCited byYear
Technical Debt in Test Automation
K Wiklund, S Eldh, D Sundmark, K Lundqvist
2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012
442012
Impediments for Automated Testing - An Empirical Analysis of a User Support Discussion Board
K Wiklund, D Sundmark, S Eldh, K Lundqvist
Seventh IEEE International Conference on Software Testing, Verification and …, 2014
252014
Impediments in Agile Software Development: An Empirical Investigation
K Wiklund, D Sundmark, S Eldh, K Lundqvist
14th International Conference of Product Focused Software Development and …, 2013
152013
Towards a Test Automation Improvement Model (TAIM)
S Eldh, K Andersson, A Ermedahl, K Wiklund
Testing: Academic & Industrial Conference - Practice and Research Techniques …, 2014
112014
Can we do useful industrial software engineering research in the shadow of Lean and Agile?
K Wiklund, S Eldh, D Sundmark, K Lundqvist
1st International Workshop on Conducting Empirical Studies in Industry (CESI), 2013
62013
Impediments for software test automation: A systematic literature review
K Wiklund, S Eldh, D Sundmark, K Lundqvist
Software Testing, Verification and Reliability, 2017
52017
A gate-level fault simulation toolkit
K Wiklund
Technical Report No. 00-17, Department of Computer Engineering, Chalmers …, 2000
42000
Impediments for Automated Software Test Execution
K Wiklund
Mälardalen University, 2015
32015
Switch-level test generation of competing bridging faults in the presence of feedback
K Wiklund, T Magnusson, P Dahlgren
Department of Computer Engineering, Chalmers University of TechnologyS-412 …, 2000
32000
The Next Level of Test Automation: What About the Users?
K Wiklund, M Wiklund
2018 IEEE International Conference on Software Testing, Verification and …, 2018
2018
Binary Decision Diagrams and Testability Measures
K Wiklund, T Magnusson
IEEE European Test Workshop ETW '01, 2001
2001
On Logic Test Generation-Algorithms and Methods for Combinational Test Generation
K Wiklund
Chalmers University of Technology, 2000
2000
Switch-Level Fault Simulation and Test Generation for Competing Bridging Faults
K Wiklund, T Magnusson, P Dahlgren
IEEE European Test Workshop ETW '98, 1998
1998
Evaluation of Reduced Ordered Binary Decision Diagrams using a Five-Valued Algebra
K Wiklund
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Articles 1–14