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Anatoly Fedorenko
Anatoly Fedorenko
Department of Metal and Semiconductor Physics, NTU Khpi
Verified email at kpi.kharkov.ua
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Cited by
Cited by
Year
High-reflectivity multilayer mirrors for a vacuum-ultraviolet interval of 35–50?? nm
YA Uspenskii, VE Levashov, AV Vinogradov, AI Fedorenko, ...
Optics Letters 23 (10), 771-773, 1998
1461998
Interlayer transition zones in Mo/Si superlattices
S Yulin, T Feigl, T Kuhlmann, N Kaiser, AI Fedorenko, VV Kondratenko, ...
Journal of Applied Physics 92 (3), 1216-1220, 2002
1352002
Структура межкристаллитных и межфазных границ
ВМ Косевич, ВМ Иевлев, ЛС Палатник, АИ Федоренко
Общество с ограниченной ответственностью" Металлургиздат", 1980
921980
Thermal stability of soft x-ray Mo–Si and MoSi2-Si multilayer mirrors
VV Kondratenko, YP Pershin, OV Poltseva, AI Fedorenko, EN Zubarev, ...
Applied optics 32 (10), 1811-1816, 1993
841993
Schwarzschild soft-x-ray microscope for imaging of nonradiating objects
IA Artioukov, AV Vinogradov, VE Asadchikov, YS Kas’yanov, RV Serov, ...
Optics letters 20 (24), 2451-2453, 1995
701995
Novel superconducting semiconducting superlattices: dislocation-induced superconductivity?
NY Fogel, AS Pokhila, YV Bomze, AY Sipatov, AI Fedorenko, RI Shekhter
Physical review letters 86 (3), 512, 2001
492001
Фокусировка атомных столкновений в кристаллах
РИ Гарбер, АИ Федоренко
Успехи физических наук 83 (7), 385-432, 1964
431964
Soft X-ray submicron imaging experiments with nanosecond exposure
IA Artyukov, AI Fedorenko, VV Kondratenko, SA Yulin, AV Vinogradov
Optics communications 102 (5-6), 401-406, 1993
411993
Structure of Intercrystallite and Interphase Boundaries
VM Kosevich, VM Ievlev, LS Palatnik, AI Fedorenko
Metallurgia, Moscow, 1980
391980
Synthesis and measurement of normal incidence X-ray multilayer mirrors optimized for a photon energy of 390 eV
IV Kozhevnikov, AI Fedorenko, VV Kondratenko, YP Pershin, SA Yulin, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1994
361994
The epitaxial growth of cobalt on copper
AI Fedorenko, R Vincent
Philosophical Magazine 24 (187), 55-62, 1971
361971
Sc–Si normal incidence mirrors for a VUV interval of 35–50 nm
YA Uspenskii, VE Levashov, AV Vinogradov, AI Fedorenko, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2000
352000
High throughput and resolution compact spectrograph for the 124–250 Å range based on MoSi2-Si sliced multilayer grating
VE Levashov, EN Zubarev, AI Fedorenko, VV Kondratenko, OV Poltseva, ...
Optics communications 109 (1-2), 1-4, 1994
351994
Superconductivity of semiconductor superlattices based on lead chalcogenides
OA Mironov, AB Savitskii, AY Sipatov, AI Fedorenko, AN Chirkin, ...
JETP Lett 48 (2), 1988
301988
Formation of dislocation superlattices in epitaxial systems
LS Palatnik, AI Fedorenko
Journal of Crystal Growth 52, 917-924, 1981
261981
Structure of sc/si multilayer mirrors in as-deposited state and after annealing
AI Fedorenko, YP Pershin, OV Poltseva, AG Ponomarenko, ...
Journal of X-ray Science and Technology 9 (1), 35-42, 2001
222001
Stigmatic high-resolution high-throughput narrow-band diffraction spectrograph employing X-ray multilayer mirrors
EN Ragozin, NN Kolachevsky, MM Mitropolsky, AI Fedorenko, ...
Physica Scripta 47 (4), 495, 1993
221993
Reflective soft x-ray microscope for the investigation of objects illuminated by laser-plasma radiation
IA Artyukov, VE Asadchikov, AV Vinogradov, YS Kas' yanov, ...
Quantum Electronics 25 (9), 919, 1995
201995
Struktura mezhkristallitnykh i mezhfaznykh granits
VM Kosevich, VM Ievlev, LS Palatnik, AI Fedorenko
Metallurgiya, Moskva, 1980
191980
(001)-oriented lead selenide films grown on silicon substrates
VV Tetyorkin, AY Sipatov, FF Sizov, AI Fedorenko, A Fedorov
Infrared physics & technology 37 (3), 379-384, 1996
181996
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