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Co-authors
Dan Keun SungProfessor Emeritus, School of Electrical Engineering, Korea Adv. Inst. of Sci. & Tech(KAIST).Verified email at kaist.ac.kr
Jae Kyun KwonAssociate Professor, Dept. of Electronic Engineering, Yeungnam UniversityVerified email at yumail.ac.kr
Ho Young HwangProfessor, School of Computer and Information Engineering, Kwangwoon UniversityVerified email at kw.ac.kr
Sungho MoonIntel Corp.Verified email at intel.com
Soon Young YoonSamsung ElectronicsVerified email at samsung.com
Yongjun KwakSystems Engineer, Intel CorporationVerified email at intel.com
Ho-Shin ChoProfessor of Electrical Engineering, Kyungpook National UniversityVerified email at ee.knu.ac.kr
Junsu KimKorea Polytechnic UniversityVerified email at ieee.org
Hyunseok LeeProfessor or Electronics and Comunications Engineering in Kwangwoon UniversityVerified email at kw.ac.kr
Chae-Bong SohnDept. of Electronics and Communications Eng., Kwangwoon UniversityVerified email at kw.ac.kr
Suwon Park
Verified email at kw.ac.kr - Homepage