Hardware Trojan detection using path delay fingerprint Y Jin, Y Makris 2008 IEEE International workshop on hardware-oriented security and trust, 51-57, 2008 | 691 | 2008 |
Counterfeit integrated circuits: A rising threat in the global semiconductor supply chain U Guin, K Huang, D DiMase, JM Carulli, M Tehranipoor, Y Makris Proceedings of the IEEE 102 (8), 1207-1228, 2014 | 344 | 2014 |
Experiences in hardware Trojan design and implementation Y Jin, N Kupp, Y Makris 2009 IEEE International Workshop on Hardware-Oriented Security and Trust, 50-57, 2009 | 255 | 2009 |
Proof-carrying hardware intellectual property: A pathway to trusted module acquisition E Love, Y Jin, Y Makris IEEE Transactions on Information Forensics and Security 7 (1), 25-40, 2011 | 150 | 2011 |
Hardware Trojans in wireless cryptographic ICs Y Jin, Y Makris IEEE Design & Test of Computers 27 (1), 26-35, 2010 | 130 | 2010 |
Error moderation in low-cost machine-learning-based analog/RF testing HG Stratigopoulos, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 130 | 2008 |
Hardware Trojan detection through golden chip-free statistical side-channel fingerprinting Y Liu, K Huang, Y Makris Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014 | 92 | 2014 |
Non-RF to RF test correlation using learning machines: A case study HGD Stratigopoulos, P Drineas, M Slamani, Y Makris 25th IEEE VLSI Test Symposium (VTS'07), 9-14, 2007 | 87 | 2007 |
Instruction-level impact analysis of low-level faults in a modern microprocessor controller M Maniatakos, N Karimi, C Tirumurti, A Jas, Y Makris IEEE Transactions on Computers 60 (9), 1260-1273, 2010 | 76 | 2010 |
What to lock? Functional and parametric locking M Yasin, A Sengupta, BC Schafer, Y Makris, O Sinanoglu, J Rajendran Proceedings of the on Great Lakes Symposium on VLSI 2017, 351-356, 2017 | 74 | 2017 |
Proof carrying-based information flow tracking for data secrecy protection and hardware trust Y Jin, Y Makris 2012 IEEE 30th VLSI Test Symposium (VTS), 252-257, 2012 | 74 | 2012 |
Soft error mitigation through selective addition of functionally redundant wires S Almukhaizim, Y Makris IEEE Transactions on Reliability 57 (1), 23-31, 2008 | 74 | 2008 |
Nonlinear decision boundaries for testing analog circuits HGD Stratigopoulos, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005 | 72 | 2005 |
Hardware Trojans in wireless cryptographic ICs: Silicon demonstration & detection method evaluation Y Liu, Y Jin, Y Makris 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 399-404, 2013 | 67 | 2013 |
Parametric counterfeit IC detection via support vector machines K Huang, JM Carulli, Y Makris 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012 | 66 | 2012 |
RF specification test compaction using learning machines HG Stratigopoulos, P Drineas, M Slamani, Y Makris IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 998 …, 2009 | 63 | 2009 |
Cycle-accurate information assurance by proof-carrying based signal sensitivity tracing Y Jin, B Yang, Y Makris 2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013 | 55 | 2013 |
Seamless integration of SER in rewiring-based design space exploration S Almukhaizim, Y Makris, YS Yang, A Veneris 2006 IEEE International Test Conference, 1-9, 2006 | 53 | 2006 |
Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines S Almukhaizim, P Drineas, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006 | 53 | 2006 |
Independent test sequence compaction through integer programming P Drineas, Y Makris Proceedings 21st International Conference on Computer Design, 380-386, 2003 | 53 | 2003 |