| Variation-aware defect characterization at cell level ZP Najafi-Haghi, M Hashemipour-Nazari, HJ Wunderlich 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 12 | 2020 |
| Resistive open defect classification of embedded cells under variations ZP Najafi-Haghi, HJ Wunderlich 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-6, 2021 | 7 | 2021 |
| On extracting reliability information from speed binning ZP Najafi-Haghi, F Klemme, H Amrouch, HJ Wunderlich 2022 IEEE European Test Symposium (ETS), 1-4, 2022 | 6 | 2022 |
| Intelligent methods for test and reliability H Amrouch, J Anders, S Becker, M Betka, G Bleher, P Domanski, ... 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 969-974, 2022 | 6 | 2022 |
| Identifying resistive open defects in embedded cells under variations ZP Najafi-Haghi, HJ Wunderlich Journal of Electronic Testing 39 (1), 27-40, 2023 | 3 | 2023 |
| Efficient and robust resistive open defect detection based on unsupervised deep learning Y Liao, ZP Najafi-Haghi, HJ Wunderlich, B Yang 2022 IEEE International Test Conference (ITC), 185-193, 2022 | 3 | 2022 |
| Rate-distortion-complexity optimization for VLSI implementation of integer motion estimation in H. 264/AVC encoder A Aminlou, Z NajafiHaghi, M Namaki-Shoushtari, MR Hashemi 2011 IEEE International Conference on Multimedia and Expo, 1-6, 2011 | 2 | 2011 |
| A TLM2. 0 assertion library with centralized monitoring approach AA Ghofrani, S Abolma'ali, ZN Haghi, Z Navabi 2010 East-West Design & Test Symposium (EWDTS), 402-406, 2010 | 2 | 2010 |
| Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection ZP Najafi-Haghi, F Klemme, H Jafarzadeh, H Amrouch, HJ Wunderlich 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-2, 2023 | 1 | 2023 |
| Robust Pattern Generation for Small Delay Faults Under Process Variations H Jafarzadeh, F Klemme, JD Reimer, ZP Najafi-Haghi, H Amrouch, ... 2023 IEEE International Test Conference (ITC), 111-116, 2023 | | 2023 |
| Test Aspects of System Health State Monitoring HJ Wunderlich, H Jafarzadeh, A Kourfali, N Lylina, ZP Najafi-Haghi 2023 IEEE 24th Latin American Test Symposium (LATS), 1-2, 2023 | | 2023 |
| Projekt-Partner W wir zu erreichen sind-Bild, W wir zu erreichen sind-Parkplatz, H Jobs, ... | | |
| Design and Test of Systems on Chip F Plan, H Jobs, UO Seminars, PO Seminars, I Polian, AF Attacks, ... | | |
| Design and Test of Systems on Chip W wir zu erreichen sind-Bild, W wir zu erreichen sind-Parkplatz, H Jobs, ... | | |
| Grundlagen der eingebetteten Systeme F Plan, H Jobs, UO Seminars, PO Seminars, I Polian, AF Attacks, ... | | |
| Grundlagen der eingebetteten Systeme W wir zu erreichen sind-Bild, W wir zu erreichen sind-Parkplatz, H Jobs, ... | | |
