Low-latency Shack–Hartmann wavefront sensor based on an industrial smart camera M Thier, R Paris, T Thurner, G Schitter IEEE Transactions on Instrumentation and Measurement 62 (5), 1241-1249, 2012 | 22 | 2012 |
Probabilistic absolute position sensor based on objective laser speckles R Paris, M Melik-Merkumians, G Schitter IEEE Transactions on Instrumentation and Measurement 65 (5), 1188-1196, 2016 | 15 | 2016 |
Knowledge driven mobile robots applied in the disassembly domain G Koppensteiner, R Hametner, R Paris, AM Passani, M Merdan The 5th International Conference on Automation, Robotics and Applications, 52-56, 2011 | 8 | 2011 |
Compensation based displacement measurement using objective laser speckles R Paris, T Thurner, G Schitter IFAC Proceedings Volumes 46 (5), 264-270, 2013 | 5 | 2013 |
Towards high speed ferrule-top atomic force microscopy PI Chang, D Chavan, R Paris, D Iannuzzi, G Schitter IFAC Proceedings Volumes 46 (5), 131-137, 2013 | 3 | 2013 |
Shack-Hartmann wavefront sensor based on an industrial smart camera R Paris, M Thier, T Thurner, G Schitter 2012 IEEE International Instrumentation and Measurement Technology …, 2012 | 3 | 2012 |
Intelligente Kameras in der Messtechnik R Paris, T Thurner, T Berndorfer, HW Yoo, G Schitter e & i Elektrotechnik und Informationstechnik 1 (129), 34-41, 2012 | 2 | 2012 |
Vision-based probabilistic absolute position sensor R Paris, M Melik-Merkumians, G Schitter 2015 IEEE International Instrumentation and Measurement Technology …, 2015 | 1 | 2015 |
Increasing sensitivity while reducing crosstalk of the force sensor in atomic force microscopes J Steininger, R Paris, G Schitter Proceedings of the 14th euspen International Conference, R. Leach, Ed 1, 321-324, 2014 | 1 | 2014 |
Method and apparatus for measuring a curved wavefront using at least one wavefront sensor G Schitter, M Thier, R Paris, S Unger, HW Yoo US Patent App. 16/311,615, 2020 | | 2020 |
Vision-based absolute position sensing on technical surfaces R Paris Technische Universität Wien, 2019 | | 2019 |
Improving the Deflection Readout Mechanism of an Atomic Force Microscope J Steininger, R Paris, G Schitter MESS14 Microelectronic Systems Symposium, Band 76 der OVE-Schriftenreihe, 22, 2014 | | 2014 |
Smart cameras as metrology systems R Paris, T Thurner, T Berndorfer, HW Yoo, G Schitter e & i Elektrotechnik und Informationstechnik 129, 34-41, 2012 | | 2012 |
Kommunikationsprozessanalyse zur Taktzeitoptimierung einer robotergestützten Montagezelle R Paris | | 2010 |