| Conductance Spectroscopy of Exfoliated Thin Flakes of NbxBi2Se3 C Kurter, ADK Finck, ED Huemiller, J Medvedeva, A Weis, JM Atkinson, ... Nano letters 19 (1), 38-45, 2018 | 25 | 2018 |
| TVS devices transient behavior modeling framework and application to Seed L Shen, S Marathe, J Meiguni, G Luo, J Zhou, D Pommerenke 2019 41st Annual EOS/ESD Symposium (EOS/ESD), 1-10, 2019 | 15 | 2019 |
| Detection of ESD-Induced Soft Failures by Analyzing Linux Kernel Function Calls X Liu, G Maghlakelidze, J Zhou, OH Izadi, L Shen, M Pommerenke, SS Ge, ... IEEE Transactions on Device and Materials Reliability 20 (1), 128-135, 2020 | 9 | 2020 |
| Robust Extended Unterminated Line (EUL) Crosstalk Characterization Techniques for High-Speed Interconnect Y Guo, DH Kim, J He, X Ye, A Sutono, V Kunda, A Luoh, Z Kiguradze, ... 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020 | 8 | 2020 |
| Andreev Reflection Spectroscopy of Topological Superconductor Candidate NbBiSe C Kurter, A Finck, E Huemiller, J Medvedeva, A Weis, J Atkinson, Y Qiu, ... arXiv preprint arXiv:1707.08516, 2017 | 6 | 2017 |
| Investigations into Methods to Stabilize the Spark in Air Discharge ESD J Zhou, K Zhou, X Yan, L Shen, D Pommerenke, G Luo 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019 | 4 | 2019 |
| IC Pin Modeling and Mitigation of ESD-Induced Soft Failures G Maghlakelidze, L Shen, H Gossner, D Pommerenke, D Kim IEEE Transactions on Electromagnetic Compatibility, 2020 | 1 | 2020 |
