Luis Felipe Lastras Martinez
Luis Felipe Lastras Martinez
University of San Luis Potosi
Verifierad e-postadress på cactus.iico.uaslp.mx - Startsida
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Model for the linear electro-optic reflectance-difference spectrum of GaAs(001) around and
A Lastras-Martínez, RE Balderas-Navarro, LF Lastras-Martínez, MA Vidal
Physical Review B 59 (15), 10234, 1999
651999
Model for the linear electro-optic reflectance-difference spectrum of GaAs(001) around and
A Lastras-Martínez, RE Balderas-Navarro, LF Lastras-Martínez, MA Vidal
Physical Review B 59 (15), 10234, 1999
651999
Reflectance anisotropy of GaAs (100): Dislocation-induced piezo-optic effects
LF Lastras-Martínez, A Lastras-Martínez
Physical Review B 54 (15), 10726, 1996
481996
Reflectance anisotropy of GaAs (100): Dislocation-induced piezo-optic effects
LF Lastras-Martínez, A Lastras-Martínez
Physical Review B 54 (15), 10726, 1996
481996
Gaas (001): Surface structure and optical properties
WG Schmidt, F Bechstedt, K Fleischer, C Cobet, N Esser, W Richter, ...
physica status solidi (a) 188 (4), 1401-1409, 2001
372001
Optical anisotropy of (001)-GaAs surface quantum wells
LF Lastras-Martinez, D Rönnow, PV Santos, M Cardona, K Eberl
Physical Review B 64 (24), 245303, 2001
352001
Optical anisotropy of (001)-GaAs surface quantum wells
LF Lastras-Martinez, D Rönnow, PV Santos, M Cardona, K Eberl
Physical Review B 64 (24), 245303, 2001
352001
Surface-stress-induced optical bulk anisotropy
K Hingerl, RE Balderas-Navarro, W Hilber, A Bonanni, D Stifter
Physical Review B 62 (19), 13048, 2000
332000
A spectrometer for the measurement of reflectance‐difference spectra
LF Lastras‐Martínez, A Lastras‐Martínez, RE Balderas‐Navarro
Review of scientific instruments 64 (8), 2147-2152, 1993
281993
Stress-induced optical anisotropies measured by modulated reflectance
LF Lastras-Martínez, RE Balderas-Navarro, A Lastras-Martínez, K Hingerl
Semiconductor science and technology 19 (9), R35, 2004
252004
Comment on “Ab Initio Calculation of Excitonic Effects in the Optical Spectra of Semiconductors”
M Cardona, LF Lastras-Martinez, DE Aspnes
Physical review letters 83 (19), 3970, 1999
231999
Effect of reconstruction-induced strain on the reflectance difference spectroscopy of GaAs (001) around and transitions
LF Lastras-Martínez, JM Flores-Camacho, RE Balderas-Navarro, ...
Physical Review B 75 (23), 235315, 2007
222007
Isotope effects on the electronic critical points of germanium: Ellipsometric investigation of the and transitions
D Rönnow, LF Lastras-Martínez, M Cardona
The European Physical Journal B-Condensed Matter and Complex Systems 5 (1 …, 1998
211998
Photoreflectance spectroscopy of CdTe(001) around and linear electro-optic spectrum
A Lastras-Martınez, RE Balderas-Navarro, P Cantú-Alejandro, ...
Journal of applied physics 86 (4), 2062-2065, 1999
201999
Determination of the piezo-optical properties of semiconductors above the fundamental gap by means of reflectance difference spectroscopy
D Rönnow, LF Lastras-Martınez, M Cardona, PV Santos
JOSA A 16 (3), 568-573, 1999
201999
Measurement of the surface strain induced by reconstructed surfaces of GaAs (001) using photoreflectance and reflectance-difference spectroscopies
LF Lastras-Martínez, JM Flores-Camacho, A Lastras-Martínez, ...
Physical review letters 96 (4), 047402, 2006
192006
Dislocation-induced effects in the reflectance-difference spectrum of semi-insulating GaAs (100)
LF Lastras-Martínez, A Lastras-Martínez
Solid state communications 98 (5), 479-483, 1996
191996
A rotating-compensator based reflectance difference spectrometer for fast spectroscopic measurements
CG Hu, LD Sun, JM Flores-Camacho, M Hohage, CY Liu, XT Hu, ...
Review of Scientific Instruments 81 (4), 043108, 2010
182010
Reflectance difference spectroscopy of under a uniaxial stress
LF Lastras-Martínez, M Chavira-Rodríguez, RE Balderas-Navarro, ...
Physical Review B 70 (3), 035306, 2004
182004
Piezo-optical coefficients of ZnSe and ZnTe above the fundamental gap
D Rönnow, M Cardona, LF Lastras-Martinez
Physical Review B 59 (8), 5581, 1999
171999
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Artiklar 1–20