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Yuri V. Gomeniuk
Yuri V. Gomeniuk
Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
Verified email at lab15.kiev.ua
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Year
Nanoparticles as antiviral agents against adenoviruses
V Lysenko, V Lozovski, M Lokshyn, YV Gomeniuk, A Dorovskih, ...
Advances in Natural Sciences: Nanoscience and Nanotechnology 9 (2), 025021, 2018
922018
Local mode frequencies of the N As− In Ga nearest-neighbor pair in (Ga, In)(As, N) alloys
HC Alt, YV Gomeniuk
Physical Review B 70 (16), 161314, 2004
242004
Effect of oxide–semiconductor interface traps on low-temperature operation of MOSFETs
VS Lysenko, IP Tyagulski, YV Gomeniuk, IN Osiyuk
Microelectronics Reliability 40 (4-5), 735-738, 2000
242000
Far-infrared absorption due to electronic transitions of N–O complexes in Czochralski-grown silicon crystals: Influence of nitrogen and oxygen concentration
HC Alt, YV Gomeniuk, F Bittersberger, A Kempf, D Zemke
Applied Physics Letters 87 (15), 2005
222005
Charge trapping in ultrathin Gd2O3 high-k dielectric
AN Nazarov, YV Gomeniuk, YY Gomeniuk, HDB Gottlob, M Schmidt, ...
Microelectronic engineering 84 (9-10), 1968-1971, 2007
212007
Carrier transfer effect on transport in p-i-n structures with Ge quantum dots
VS Lysenko, YV Gomeniuk, VV Strelchuk, AS Nikolenko, SV Kondratenko, ...
Physical Review B 84 (11), 115425, 2011
202011
Splitting of the local mode frequency of substitutional nitrogen in (Ga, In)(As, N) alloys due to symmetry lowering
HC Alt, YV Gomeniuk, G Mussler
Semiconductor science and technology 21 (10), 1425, 2006
152006
Plasma treatment as a versatile tool for tuning of sorption properties of thin nanoporous carbon films
OM Slobodian, PN Okholin, PM Lytvyn, SV Malyuta, OY Khyzhun, ...
Applied Surface Science 544, 148876, 2021
142021
Effect of traps in the transition Si/SiO2 layer on input characteristics of SOI transistors
VS Lysenko, IP Tyagulski, YV Gomeniuk, IN Osiyuk
Microelectronics reliability 40 (4-5), 799-802, 2000
142000
Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering
AV Vasin, AV Rusavsky, EG Bortchagovsky, YV Gomeniuk, AS Nikolenko, ...
Vacuum 174, 109199, 2020
132020
Low-temperature conductance measurements of surface states in HfO2–Si structures with different gate materials
Y Gomeniuk, A Nazarov, Y Vovk, Y Lu, O Buiu, S Hall, JK Efavi, ...
Materials science in semiconductor processing 9 (6), 980-984, 2006
132006
Method to determine carbon in silicon by infrared absorption spectroscopy
HC Alt, Y Gomeniuk, B Wiedemann, H Riemann
Journal of The Electrochemical Society 150 (8), G498, 2003
132003
Thermally stimulated field emission of charge from traps in the transition layer of Si SiO2 structures
YV Gomeniuk, RN Litovski, VS Lysenko, IN Osiyuk, IP Tyagulski
Applied surface science 55 (2-3), 179-185, 1992
131992
Charge states and quantitative infrared spectroscopy of electrically active oxygen centers in gallium arsenide
HC Alt, YV Gomeniuk, U Kretzer
Journal of applied physics 101 (7), 2007
122007
Quantitative spectroscopy of substitutional nitrogen in GaAs1− xNx epitaxial layers by local vibrational mode absorption
HC Alt, Y Gomeniuk, G Ebbinghaus, A Ramakrishnan, H Riechert
Semiconductor science and technology 18 (4), 303, 2003
112003
Charge carrier transport, trapping, and recombination in PEDOT: PSS/n-Si solar cells
S Kondratenko, V Lysenko, YV Gomeniuk, O Kondratenko, Y Kozyrev, ...
ACS Applied Energy Materials 2 (8), 5983-5991, 2019
102019
Effect of Ge Nanoislands on Lateral Photoconductivity of Ge-SiOX-Si Structures
VS Lysenko, YV Gomeniuk, YN Kozyrev, MY Rubezhanska, VK Skylar, ...
Advanced Materials Research 276, 179-186, 2011
92011
Analysis of electrically active N–O complexes in nitrogen-doped CZ silicon crystals by FTIR spectroscopy
HC Alt, YV Gomeniuk, F Bittersberger, A Kempf, D Zemke
Materials science in semiconductor processing 9 (1-3), 114-116, 2006
92006
Highly porous carbon films fabricated by magnetron plasma enhanced chemical vapor deposition: Structure, properties and implementation
OM Slobodian, AV Rusavsky, AV Vasin, OY Khyzhun, OI Gudymenko, ...
Applied Surface Science 496, 143735, 2019
82019
Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements
YV Gomeniuk
Semiconductor Physics Quantum Electronics & Optoelectronics, 2012
82012
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