| Surface roughness of water measured by x-ray reflectivity A Braslau, M Deutsch, PS Pershan, AH Weiss, J Als-Nielsen, J Bohr Physical review letters 54 (2), 114, 1985 | 540 | 1985 |
| Auger-electron emission resulting from the annihilation of core electrons with low-energy positrons A Weiss, R Mayer, M Jibaly, C Lei, D Mehl, KG Lynn Physical review letters 61 (19), 2245, 1988 | 235 | 1988 |
| Smectic layering at the free surface of liquid crystals in the nematic phase: X-ray reflectivity PS Pershan, A Braslau, AH Weiss, J Als-Nielsen Physical Review A 35 (11), 4800, 1987 | 177 | 1987 |
| The Handbook of surface imaging and visualization AT Hubbard CRC press, 1995 | 145 | 1995 |
| Low-energy positron diffraction from a Cu (111) surface IJ Rosenberg, AH Weiss, KF Canter Physical Review Letters 44 (17), 1139, 1980 | 143 | 1980 |
| Theoretical study of the application of positron-induced Auger-electron spectroscopy KO Jensen, A Weiss Physical Review B 41 (7), 3928, 1990 | 121 | 1990 |
| Electrodeposition and characterization of SnS thin films K Mishra, K Rajeshwar, A Weiss, M Murley, RD Engelken, M Slayton, ... Journal of the Electrochemical society 136 (7), 1915, 1989 | 114 | 1989 |
| Sensitivity of positron-annihilation-induced Auger-electron spectroscopy to the top surface layer D Mehl, AR Köymen, KO Jensen, F Gotwald, A Weiss Physical Review B 41 (1), 799, 1990 | 90 | 1990 |
| Apparatus for positron annihilation‐induced Auger electron spectroscopy C Lei, D Mehl, AR Koymen, F Gotwald, M Jibaly, A Weiss Review of scientific instruments 60 (12), 3656-3660, 1989 | 72 | 1989 |
| Temperature-dependent top-layer composition of ultrathin Pd films on Cu (100) AR Koymen, KH Lee, G Yang, KO Jensen, AH Weiss Physical Review B 48 (3), 2020, 1993 | 63 | 1993 |
| Low-energy positron and electron diffraction from Cu (100) and Cu (111) AH Weiss, IJ Rosenberg, KF Canter, CB Duke, A Paton Physical Review B 27 (2), 867, 1983 | 63 | 1983 |
| Auger-Mediated Sticking of Positrons to Surfaces: Evidence for a Single-Step Transition<? format?> from a Scattering State to a Surface Image Potential Bound State S Mukherjee, MP Nadesalingam, P Guagliardo, AD Sergeant, ... Physical review letters 104 (24), 247403, 2010 | 51 | 2010 |
| Elimination of the secondary electron background in Auger electron spectroscopy using low energy positron excitation A Weiss, D Mehl, AR Koymen, KH Lee, C Lei Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8 (3 …, 1990 | 47 | 1990 |
| Measurement of the positron work functions of polycrystalline Fe, Mo, Ni, Pt, Ti, and V M Jibaly, A Weiss, AR Koymen, D Mehl, L Stiborek, C Lei Physical Review B 44 (22), 12166, 1991 | 46 | 1991 |
| Temperature dependence of low-energy positron-induced Auger-electron emission: Evidence for high surface sensitivity R Mayer, A Schwab, A Weiss Physical Review B 42 (4), 1881, 1990 | 43 | 1990 |
| Comparative study of secondary-electron emission from positron and electron bombardment of Ni, Si, and MgO R Mayer, A Weiss Physical Review B 38 (16), 11927, 1988 | 40 | 1988 |
| Novel x‐ray diffractometer for liquid surface studies AH Weiss, M Deutsch, A Braslau, BM Ocko, PS Pershan Review of scientific instruments 57 (10), 2554-2559, 1986 | 40 | 1986 |
| Study of the growth and stability of ultra-thin films of Au deposited on Si (1 0 0) and Si (1 1 1) JH Kim, G Yang, S Yang, AH Weiss Surface science 475 (1-3), 37-46, 2001 | 39 | 2001 |
| Positron annihilation induced Auger electron spectroscopy studies of submonolayer Au on Cu (100): Direct evidence for positron localization at sites containing Au atoms KH Lee, G Yang, AR Koymen, KO Jensen, AH Weiss Physical review letters 72 (12), 1866, 1994 | 37 | 1994 |
| Positron states on the Cs/Cu (100) surface AR Koymen, KH Lee, D Mehl, A Weiss, KO Jensen Physical review letters 68 (15), 2378, 1992 | 36 | 1992 |
Varghese Anto ChirayathAssistant Professor of Research, Department of Physics, University of Texas, ArlingtonVerified email at uta.edu
