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Dan Alexandrescu
Dan Alexandrescu
IROC Technologies
Verifierad e-postadress på iroctech.com
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Evaluation of a soft error tolerance technique based on time and/or space redundancy
L Anghel, D Alexandrescu, M Nicolaidis
Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000
1632000
Low-cost highly-robust hardened cells using blocking feedback transistors
M Nicolaidis, R Perez, D Alexandrescu
26th IEEE VLSI Test Symposium (vts 2008), 371-376, 2008
1092008
New methods for evaluating the impact of single event transients in VDSM ICs
D Alexandrescu, L Anghel, M Nicolaidis
17th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2002
962002
Comprehensive analysis of sequential and combinational soft errors in an embedded processor
M Ebrahimi, A Evans, MB Tahoori, E Costenaro, D Alexandrescu, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
662015
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales
M Ebrahimi, A Evans, MB Tahoori, R Seyyedi, E Costenaro, ...
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
622014
Study of neutron soft error rate (SER) sensitivity: Investigation of upset mechanisms by comparative simulation of FinFET and planar MOSFET SRAMs
J Noh, V Correas, S Lee, J Jeon, I Nofal, J Cerba, H Belhaddad, ...
IEEE Transactions on Nuclear Science 62 (4), 1642-1649, 2015
602015
New techniques for SET sensitivity and propagation measurement in flash-based FPGAs
A Evans, D Alexandrescu, V Ferlet-Cavrois, M Nicolaidis
IEEE Transactions on Nuclear Science 61 (6), 3171-3177, 2014
452014
Design for soft error resiliency in internet core routers
AL Silburt, A Evans, I Perryman, SJ Wen, D Alexandrescu
IEEE Transactions on Nuclear Science 56 (6), 3551-3555, 2009
442009
Simulating single event transients in VDSM ICs for ground level radiation
D Alexandrescu, L Anghel, M Nicolaidis
Journal of Electronic Testing 20, 413-421, 2004
422004
Detailed SET measurement and characterization of a 65 nm bulk technology
M Glorieux, A Evans, V Ferlet-Cavrois, C Boatella-Polo, D Alexandrescu, ...
IEEE Transactions on Nuclear Science 64 (1), 81-88, 2016
402016
A practical approach to single event transients analysis for highly complex designs
D Alexandrescu, E Costenaro, M Nicolaidis
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011
352011
Single event multiple transient (SEMT) measurements in 65 nm bulk technology
A Evans, M Glorieux, D Alexandrescu, CB Polo, V Ferlet-Cavrois
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
322016
A comprehensive soft error analysis methodology for SoCs/ASICs memory instances
D Alexandrescu
2011 IEEE 17th International On-Line Testing Symposium, 175-176, 2011
322011
Hierarchical RTL-based combinatorial SER estimation
A Evans, D Alexandrescu, E Costenaro, L Chen
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 139-144, 2013
292013
A practical approach to single event transient analysis for highly complex design
E Costenaro, D Alexandrescu, K Belhaddad, M Nicolaidis
Journal of Electronic Testing 29, 301-315, 2013
292013
Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
M Glorieux, A Evans, T Lange, AD In, D Alexandrescu, C Boatella-Polo, ...
2018 IEEE Radiation Effects Data Workshop (REDW), 1-5, 2018
252018
Cardiac tumors
AO Petris, DM Alexandrescu, II Costache
The Medical-Surgical Journal 118 (2), 289-292, 2014
242014
Riif-reliability information interchange format
A Evans, M Nicolaidis, SJ Wen, D Alexandrescu, E Costenaro
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 103-108, 2012
232012
A systematical method of quantifying SEU FIT
SJ Wen, D Alexandrescu, R Perez
2008 14th IEEE International On-Line Testing Symposium, 109-114, 2008
232008
Towards optimized functional evaluation of SEE-induced failures in complex designs
D Alexandrescu, E Costenaro
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 182-187, 2012
222012
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Artiklar 1–20