Antonio Rubio
Antonio Rubio
Professor of Electrical Engineering (UPC)
Verified email at upc.edu
Title
Cited by
Cited by
Year
Human powered piezoelectric batteries to supply power to wearable electronic devices
JL González, A Rubio, F Moll
International journal of the Society of Materials Engineering for Resources …, 2002
1712002
Analysis and solutions for switching noise coupling in mixed-signal ICs
X Aragones, JL Gonzalez, A Rubio
Springer Science & Business Media, 2013
1682013
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits
A Rubio, N Itazaki, X Xu, K Kinoshita
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1431994
Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS
R Rodríguez-Montañés, JA Segura, VH Champac, J Figueras, JA Rubio
1991, Proceedings. International Test Conference, 510, 1991
1221991
Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/testing
VH Champac, A Rubio, J Figueras
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1171994
Thermal coupling in integrated circuits: application to thermal testing
J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys
IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001
782001
Dynamic surface temperature measurements in ICs
J Altet, W Claeys, S Dilhaire, A Rubio
Proceedings of the IEEE 94 (8), 1519-1533, 2006
762006
Experimental comparison of substrate noise coupling using different wafer types
X Aragones, A Rubio
IEEE Journal of Solid-State Circuits 34 (10), 1405-1409, 1999
681999
Quiescent current sensor circuits in digital VLSI CMOS testing
A Rubio, J Figueras, J Segura
Electronics Letters 26 (15), 1204-1206, 1990
641990
A prospect on the use of piezoelectric effect to supply power to wearable electronic devices
JL Gonzalez, A Rubio, F Moll
Proceedings of the International Conference on Materials Engineering …, 2001
602001
A detailed analysis of GOS defects in MOS transistors: Testing implications at circuit level
J Segura, C De Benito, A Rubio, CF Hawkins
Proceedings of 1995 IEEE International Test Conference (ITC), 544-551, 1995
571995
Noise generation and coupling mechanisms in deep-submicron ICs
X Aragonès, JL González, F Moll, A Rubio
IEEE Design & Test of Computers 19 (5), 27-35, 2002
542002
Fault Modelling of Gate Oxide Short, Floating Gate and Bridging Failuers in CMOS Circuit
VH Champac
Proc. of European Test Conf., 143-148, 1991
541991
Four different approaches for the measurement of IC surface temperature: application to thermal testing
J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ...
Microelectronics journal 33 (9), 689-696, 2002
522002
Quiescent current analysis and experimentation of defective CMOS circuits
JA Segura, VH Champac, R Rodríguez-Montañés, J Figueras, JA Rubio
Journal of Electronic Testing 3 (4), 337-348, 1992
511992
An approach to crosstalk effect analysis and avoidance techniques in digital CMOS VLSI circuits
R Anglada, A Rubio
International Journal of Electronics 65 (1), 9-17, 1988
511988
Substrate coupling evaluation in BiCMOS technology
JM Casalta, X Aragones, A Rubio
IEEE Journal of Solid-State Circuits 32 (4), 598-603, 1997
481997
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors
J Segura, C De Benito, A Rubio, CF Hawkins
Journal of Electronic Testing 8 (3), 229-239, 1996
441996
Spurious signals in digital CMOS VLSI circuits: a propagation analysis
F Moll, A Rubio
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal …, 1992
441992
Thermal testing of integrated circuits
J Altet, A Rubio
Springer Science & Business Media, 2013
412013
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