Stefan Depeweg
Stefan Depeweg
Siemens AG
Verified email at uos.de
Title
Cited by
Cited by
Year
Decomposition of uncertainty in bayesian deep learning for efficient and risk-sensitive learning
S Depeweg, JM HernŠndez-Lobato, F Doshi-Velez, S Udluft
ICML, 2018
125*2018
Learning and policy search in stochastic dynamical systems with bayesian neural networks
S Depeweg, JM HernŠndez-Lobato, F Doshi-Velez, S Udluft
International Conference on Learning Representations (ICLR 2017), 2017
1192017
A Benchmark Environment Motivated by Industrial Control Problems
D Hein, S Depeweg, M Tokic, S Udluft, A Hentschel, TA Runkler, ...
IEEE Symposium on Computational Intelligence (IEEE SSCI 2017), 2017
292017
Uncertainty Decomposition in Bayesian Neural Networks with Latent Variables
S Depeweg, JM HernŠndez-Lobato, F Doshi-Velez, S Udluft
ICML 2017 Workshop on Reliable Machine Learning in the Wild, 2017
232017
Solving bongard problems with a visual language and pragmatic reasoning
S Depeweg, CA Rothkopf, F Jškel
arXiv preprint arXiv:1804.04452, 2018
112018
Modeling Epistemic and Aleatoric Uncertainty with Bayesian Neural Networks and Latent Variables
S Depeweg
PhD Thesis, 2019
102019
Sensitivity Analysis for Predictive Uncertainty in Bayesian Neural Networks
S Depeweg, JM HernŠndez-Lobato, S Udluft, T Runkler
ESANN 2018, 2018
62018
Learning navigation attractors for mobile robots with reinforcement learning and reservoir computing
EA Antonelo, S Depeweg, B Schrauwen
Proceedings of the X Brazilian Congress on Computational Intelligence (CBIC), 2011
32011
Computer-implemented method for estimating a technical behaviour of a device
S Depeweg, MM Geipel, M Kaiser, S Udluft
EP Patent EP3623881A1, 2020
2020
Method and device for the training of a machining learning routine for controlling a technical system
S Depeweg, MM Geipel, G Marquardt, D Seidel, C Tietz
EP Patent EP3605404A1, 2020
2020
Method for predicting a switching time of a signal group of a signaling system
S Depeweg, H Frank, R Grothmann, F Rudolph, V Sterzing, M Tokic, ...
DE Patent DE102017213350A1, 2019
2019
A benchmark environment motivated by industrial control problems Download PDF
D Hein, S Depeweg, M Tokic, S Udluft, A Hentschel, TA Runkler, ...
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