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Kristof Paredis
Kristof Paredis
Verifierad e-postadress på imec.be
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Flexibility of a combined heat and power system with thermal energy storage for district heating
T Nuytten, B Claessens, K Paredis, J Van Bael, D Six
Applied energy 104, 583-591, 2013
4722013
Evolution of the Structure and Chemical State of Pd Nanoparticles during the in Situ Catalytic Reduction of NO with H2
K Paredis, LK Ono, F Behafarid, Z Zhang, JC Yang, AI Frenkel, ...
Journal of the american chemical society 133 (34), 13455-13464, 2011
1212011
Thermodynamic properties of Pt nanoparticles: Size, shape, support, and adsorbate effects
BR Cuenya, MA Ortigoza, LK Ono, F Behafarid, S Mostafa, JR Croy, ...
Physical review b 84 (24), 245438, 2011
652011
Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity
D Chiappe, J Ludwig, A Leonhardt, S El Kazzi, AN Mehta, T Nuytten, ...
Nanotechnology 29 (42), 425602, 2018
642018
Structure, chemical composition, and reactivity correlations during the in situ oxidation of 2-Propanol
K Paredis, LK Ono, S Mostafa, L Li, Z Zhang, JC Yang, L Barrio, AI Frenkel, ...
Journal of the American Chemical Society 133 (17), 6728-6735, 2011
552011
H2S exposure of a (100) Ge surface: Evidences for a (2× 1) electrically passivated surface
M Houssa, D Nelis, D Hellin, G Pourtois, T Conard, K Paredis, ...
Applied physics letters 90 (22), 2007
542007
Dopant, composition and carrier profiling for 3D structures
W Vandervorst, C Fleischmann, J Bogdanowicz, A Franquet, U Celano, ...
Materials Science in Semiconductor Processing 62, 31-48, 2017
502017
The influence of interface roughness on the magnetic properties of exchange biased CoO/Fe thin films
C Fleischmann, F Almeida, J Demeter, K Paredis, A Teichert, R Steitz, ...
Journal of Applied Physics 107 (11), 2010
382010
Mesoscopic physical removal of material using sliding nano-diamond contacts
U Celano, FC Hsia, D Vanhaeren, K Paredis, TEM Nordling, JG Buijnsters, ...
Scientific reports 8 (1), 2994, 2018
352018
Size-dependent evolution of the atomic vibrational density of states and thermodynamic properties of isolated Fe nanoparticles
BR Cuenya, LK Ono, JR Croy, K Paredis, A Kara, H Heinrich, J Zhao, ...
Physical Review B 86 (16), 165406, 2012
342012
Experimental and theoretical study of Ge surface passivation
M Houssa, G Pourtois, B Kaczer, B De Jaeger, FE Leys, D Nelis, ...
Microelectronic engineering 84 (9-10), 2267-2273, 2007
252007
Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
T Hantschel, M Tsigkourakos, L Zha, T Nuytten, K Paredis, B Majeed, ...
Microelectronic Engineering 159, 46-50, 2016
242016
Electrical properties of extended defects in strain relaxed GeSn
S Gupta, E Simoen, R Loo, Y Shimura, C Porret, F Gencarelli, K Paredis, ...
Applied Physics Letters 113 (2), 2018
232018
Effects of buried grain boundaries in multilayer MoS2
J Ludwig, AN Mehta, M Mascaro, U Celano, D Chiappe, H Bender, ...
Nanotechnology 30 (28), 285705, 2019
202019
Ferroelectricity in Si-doped hafnia: probing challenges in absence of screening charges
U Celano, A Gomez, P Piedimonte, S Neumayer, L Collins, M Popovici, ...
Nanomaterials 10 (8), 1576, 2020
192020
Fabrication of magnetic tunnel junctions connected through a continuous free layer to enable spin logic devices
D Wan, M Manfrini, A Vaysset, L Souriau, L Wouters, A Thiam, ...
Japanese Journal of Applied Physics 57 (4S), 04FN01, 2018
192018
Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy
C Fleischmann, K Paredis, D Melkonyan, W Vandervorst
Ultramicroscopy 194, 221-226, 2018
182018
The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurements
K Pandey, K Paredis, T Hantschel, C Drijbooms, W Vandervorst
Scientific Reports 10 (1), 14893, 2020
152020
The influence of a Cu buffer layer on the self-assembly of iron silicide nanostructures on Si (111)
K Paredis, K Vanormelingen, A Vantomme
Applied Physics Letters 92 (4), 2008
112008
Overcoated diamond tips for nanometer-scale semiconductor device characterization
T Hantschel, M Tsigkourakos, J Kluge, T Werner, L Zha, K Paredis, ...
Microelectronic Engineering 141, 1-5, 2015
92015
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Artiklar 1–20