Campbell Millar
TitleCited byYear
A self-consistent full 3-D real-space NEGF simulator for studying nonperturbative effects in nano-MOSFETs
A Martinez, M Bescond, JR Barker, A Svizhenko, MP Anantram, C Millar, ...
IEEE Transactions on Electron Devices 54 (9), 2213-2222, 2007
1402007
Analysis of threshold voltage distribution due to random dopants: A 100 000-sample 3-D simulation study
D Reid, C Millar, G Roy, S Roy, A Asenov
IEEE Transactions on Electron Devices 56 (10), 2255-2263, 2009
782009
Accurate statistical description of random dopant-induced threshold voltage variability
C Millar, D Reid, G Roy, S Roy, A Asenov
IEEE Electron Device Letters 29 (8), 946-948, 2008
762008
Statistical-variability compact-modeling strategies for BSIM4 and PSP
B Cheng, D Dideban, N Moezi, C Millar, G Roy, X Wang, S Roy, A Asenov
IEEE Design & Test of Computers 27 (2), 26-35, 2010
622010
Understanding LER-Induced MOSFET Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples
D Reid, C Millar, S Roy, A Asenov
IEEE Transactions on Electron Devices 57 (11), 2801-2807, 2010
482010
Interplay between process-induced and statistical variability in 14-nm CMOS technology double-gate SOI FinFETs
X Wang, B Cheng, AR Brown, C Millar, JB Kuang, S Nassif, A Asenov
IEEE Transactions on Electron Devices 60 (8), 2485-2492, 2013
472013
Advanced simulation of statistical variability and reliability in nano CMOS transistors
A Asenov, S Roy, RA Brown, G Roy, C Alexander, C Riddet, C Millar, ...
2008 IEEE International Electron Devices Meeting, 1-1, 2008
402008
Evaluation of statistical variability in 32 and 22 nm technology generation LSTP MOSFETs
B Cheng, S Roy, AR Brown, C Millar, A Asenov
Solid-State Electronics 53 (7), 767-772, 2009
372009
Variability aware simulation based design-technology cooptimization (DTCO) flow in 14 nm FinFET/SRAM cooptimization
A Asenov, B Cheng, X Wang, AR Brown, C Millar, C Alexander, ...
IEEE Transactions on Electron Devices 62 (6), 1682-1690, 2014
342014
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review
L Gerrer, J Ding, SM Amoroso, F Adamu-Lema, R Hussin, D Reid, C Millar, ...
Microelectronics Reliability 54 (4), 682-697, 2014
312014
Predictive simulation and benchmarking of Si and Ge pMOS FinFETs for future CMOS technology
L Shifren, R Aitken, AR Brown, V Chandra, B Cheng, C Riddet, ...
IEEE Transactions on Electron Devices 61 (7), 2271-2277, 2014
252014
Extended Analysis of the -FET: Operation as Capacitorless eDRAM
C Navarro, J Lacord, MS Parihar, F Adamu-Lema, M Duan, N Rodriguez, ...
IEEE Transactions on Electron Devices 64 (11), 4486-4491, 2017
212017
Simulation based transistor-SRAM co-design in the presence of statistical variability and reliability
A Asenov, B Cheng, X Wang, AR Brown, D Reid, C Millar, C Alexander
2013 IEEE International Electron Devices Meeting, 33.1. 1-33.1. 4, 2013
202013
Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology
L Gerrer, SM Amoroso, P Asenov, J Ding, B Cheng, F Adamu-Lema, ...
2013 IEEE International Reliability Physics Symposium (IRPS), 3A. 2.1-3A. 2.5, 2013
202013
3D coupled electro-thermal FinFET simulations including the fin shape dependence of the thermal conductivity
L Wang, AR Brown, M Nedjalkov, C Alexander, B Cheng, C Millar, ...
2014 International Conference on Simulation of Semiconductor Processes and …, 2014
192014
Understanding LER-induced statistical variability: A 35,000 sample 3D simulation study
D Reid, C Millar, G Roy, S Roy, A Asenov
2009 Proceedings of the European Solid State Device Research Conference, 423-426, 2009
192009
-FET as Capacitor-Less eDRAM Cell For High-Density Integration
C Navarro, M Duan, MS Parihar, F Adamu-Lema, S Coseman, J Lacord, ...
IEEE Transactions on Electron Devices 64 (12), 4904-4909, 2017
182017
Impact of self-heating on the statistical variability in bulk and SOI FinFETs
L Wang, AR Brown, M Nedjalkov, C Alexander, B Cheng, C Millar, ...
IEEE Transactions on Electron Devices 62 (7), 2106-2112, 2015
182015
The evolution of standard cell libraries for future technology nodes
JA Walker, JA Hilder, D Reid, A Asenov, S Roy, C Millar, AM Tyrrell
Genetic Programming and Evolvable Machines 12 (3), 235-256, 2011
182011
Understanding LER-Induced MOSFETVariability—Part II: Reconstructing the Distribution
D Reid, C Millar, S Roy, A Asenov
IEEE Transactions on Electron Devices 57 (11), 2808-2813, 2010
182010
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Articles 1–20