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Haralampos-G. Stratigopoulos
Haralampos-G. Stratigopoulos
Sorbonne Université, CNRS, LIP6
Verifierad e-postadress på lip6.fr
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Error moderation in low-cost machine-learning-based analog/RF testing
HG Stratigopoulos, Y Makris
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
1582008
Defect filter for alternate RF test
HG Stratigopoulos, S Mir, E Acar, S Ozev
2010 15th IEEE European Test Symposium, 265-270, 2010
1002010
Non-RF to RF test correlation using learning machines: A case study
HGD Stratigopoulos, P Drineas, M Slamani, Y Makris
25th IEEE VLSI Test Symposium (VTS'07), 9-14, 2007
972007
Nonlinear decision boundaries for testing analog circuits
HGD Stratigopoulos, Y Makris
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005
782005
RF specification test compaction using learning machines
HG Stratigopoulos, P Drineas, M Slamani, Y Makris
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 998 …, 2009
762009
Machine learning applications in IC testing
HG Stratigopoulos
2018 IEEE 23rd European Test Symposium (ETS), 1-10, 2018
752018
Evaluation of analog/RF test measurements at the design stage
HG Stratigopoulos, S Mir, A Bounceur
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009
732009
Adaptive alternate analog test
HG Stratigopoulos, S Mir
IEEE Design & Test of Computers 29 (4), 71-79, 2012
632012
Sensors for built-in alternate RF test
L Abdallah, HG Stratigopoulos, C Kelma, S Mir
2010 15th IEEE European Test Symposium, 49-54, 2010
632010
Diagnosis of local spot defects in analog circuits
K Huang, HG Stratigopoulos, S Mir, C Hora, Y Xing, B Kruseman
IEEE Transactions on Instrumentation and Measurement 61 (10), 2701-2712, 2012
622012
Fault diagnosis of analog circuits based on machine learning
K Huang, HG Stratigopoulos, S Mir
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
612010
One-shot non-intrusive calibration against process variations for analog/RF circuits
M Andraud, HG Stratigopoulos, E Simeu
IEEE Transactions on Circuits and Systems I: Regular Papers 63 (11), 2022-2035, 2016
522016
Estimation of analog parametric test metrics using copulas
A Bounceur, S Mir, HG Stratigopoulos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011
452011
MixLock: Securing mixed-signal circuits via logic locking
J Leonhard, M Yasin, S Turk, MT Nabeel, MM Louërat, R Chotin-Avot, ...
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 84-89, 2019
442019
Test metrics model for analog test development
HG Stratigopoulos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
442012
Fast Monte Carlo-based estimation of analog parametric test metrics
HG Stratigopoulos, S Sunter
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
432014
Defect-oriented non-intrusive RF test using on-chip temperature sensors
L Abdallah, HG Stratigopoulos, S Mir, J Altet
2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013
412013
Experiences with non-intrusive sensors for RF built-in test
L Abdallah, HG Stratigopoulos, S Mir, C Kelma
2012 IEEE International Test Conference, 1-8, 2012
402012
Analog neural network design for RF built-in self-test
D Maliuk, HG Stratigopoulos, H Huang, Y Makris
2010 IEEE International Test Conference, 1-10, 2010
392010
Enrichment of limited training sets in machine-learning-based analog/RF test
HG Stratigopoulos, S Mir, Y Makris
2009 Design, Automation & Test in Europe Conference & Exhibition, 1668-1673, 2009
392009
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