| Structure of Ag (111)− p (4× 4)− O: No Silver Oxide M Schmid, A Reicho, A Stierle, I Costina, J Klikovits, P Kostelnik, O Dubay, ... Physical review letters 96 (14), 146102, 2006 | 178 | 2006 |
| The Pd (100)-(5× 5) R27°–O surface oxide: A LEED, DFT and STM study P Kostelník, N Seriani, G Kresse, A Mikkelsen, E Lundgren, V Blum, ... Surface science 601 (6), 1574-1581, 2007 | 122 | 2007 |
| Gallium structure on the Si (111)-(7× 7) surface: influence of Ga coverage and temperature J Čechal, M Kolibal, P Kostelnik, T Šikola Journal of Physics: Condensed Matter 19 (1), 016011, 2006 | 25 | 2006 |
| Method of forming a gettering structure having reduced warpage and gettering a semiconductor wafer therewith D Lysacek, J Vojtechovska, L Dornak, P Kostelnik, L Valek, P Panek US Patent 8,846,500, 2014 | 10 | 2014 |
| A LEED study of NO superstructures on the Pd (111) surface P Kostelník, T Šikola, P Varga, M Schmid Journal of Physics: Condensed Matter 21 (13), 134005, 2009 | 9 | 2009 |
| In situ analysis of Ga-ultrathin films by TOF-LEIS M Kolíbal, S Průša, M Plojhar, P Bábor, M Potoček, O Tomanec, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006 | 8 | 2006 |
| Temperature effect on Al predose and AlN nucleation affecting the buffer layer performance for the GaN-on-Si based high-voltage devices T Novák, P Kostelník, M Konečný, J Čechal, M Kolíbal, T Šikola Japanese Journal of Applied Physics 58 (SC), SC1018, 2019 | 7 | 2019 |
| Semiconductor devices and methods of making the same J Sik, P Kostelník, L Válek, M Lorenc, M Pospìsil, D Lysácek, JM Parsey Jr US Patent App. 14/200,283, 2014 | 6 | 2014 |
| A study of Ga layers on Si (1 0 0)-(2× 1) by SR-PES: Influence of adsorbed water J Čechal, J Mach, S Voborný, P Kostelník, P Bábor, J Spousta, T Šikola Surface science 601 (9), 2047-2053, 2007 | 6 | 2007 |
| Analysis of strain and dislocation evolution during MOCVD growth of an AlGaN/GaN power high-electron-mobility transistor structure M Rudinsky, E Yakovlev, R Talalaev, T Novak, P Kostelnik, J Sik Japanese Journal of Applied Physics 58 (SC), SCCD26, 2019 | 5 | 2019 |
| Selective wet etching and hydrolysis of polycrystalline AlN films grown by metal organic chemical vapor deposition A Constant, P Coppens, J Baele, H Ziad, T Novak, P Kostelnik, ... Materials Science in Semiconductor Processing 137, 106157, 2022 | 4 | 2022 |
| Correlation of Structure and EBIC Contrast from Threading Dislocations in AlN/Si Films P Vacek, P Kostelník, R Gröger physica status solidi (b) 256 (11), 1900279, 2019 | 2 | 2019 |
| Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1− xN/AlN/Si structures C Wang, O Caha, F Münz, P Kostelník, T Novák, J Humlíček Applied Surface Science 421, 859-865, 2017 | 1 | 2017 |
| Semiconductor devices and methods of making the same P Kostelnik, M Lorenc, D Lysá, JM Parsey Jr US Patent 9,355,965, 2016 | 1 | 2016 |
| Methods of laser marking semiconductor substrates P Kostelník, M Lorenc, D Lysá, JM Parsey Jr US Patent 9,099,481, 2015 | 1 | 2015 |
| Polycrystalline silicon gettering layers with controlled residual stress D Lysáček, P Kostelník, P Pánek Solid State Phenomena 205, 284-289, 2014 | 1 | 2014 |
| Lattice constants and optical response of pseudomorph Si-rich SiGe: B O Caha, P Kostelník, J Šik, YD Kim, J Humlíček Applied Physics Letters 103 (20), 2013 | 1 | 2013 |
| Process of forming an electronic device including a doped gate electrode P Kostelnik, T Novak, P Coppens, P Moens, A Banerjee US Patent 11,942,326, 2024 | | 2024 |
| (Invited) Challenges in Fabricating and Scaling up Silicon Carbide Wafers and Devices H Das, P Kostelnik, K Kocian, T Novak, M Domeij, S Sunkari, J Justice Electrochemical Society Meeting Abstracts 244, 1676-1676, 2023 | | 2023 |
| Optimization of the bond and etch-back silicon-on-insulator manufacturing processes P Kostelník, J Šik Advanced Science, Engineering and Medicine 5 (6), 603-607, 2013 | | 2013 |
Georg KresseUniversity of Vienna, Faculty of Physics, Professor for Computational Quantum MechanicsVerified email at univie.ac.at
