Jin Wang
Jin Wang
Department of Chemical Engineering, Auburn University
Verified email at auburn.edu - Homepage
Cited by
Cited by
Fault Detection Using the k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes
QP He, J Wang
IEEE Transactions on Semiconductor Manufacturing 20 (4), 443-456, 2007
A new subspace identification approach based on principal component analysis
J Wang, SJ Qin
Journal of Process Control 12 (8), 841-855, 2002
A new fault diagnosis method using fault directions in Fisher discriminant analysis
QP He, J Wang, SJ Qin
AIChE Journal 51 (2), 555-571, 2005
Semiconductor manufacturing process control and monitoring: A fab-wide framework
SJ Qin, G Cherry, R Good, J Wang, CA Harrison
Journal of Process Control 16 (3), 179-191, 2006
A Curve fitting method for detecting valve stiction in oscillating control loops
QP He, J Wang, M Pottmann, SJ Qin
Ind. Eng. Chem. Res. 46 (13), 4549-4560, 2007
Multivariate Statistical Process Monitoring Based on Statistics Pattern Analysis
J Wang, QP He
Ind. Eng. Chem. Res 49 (17), 7858-7869, 2010
Statistics Pattern Analysis : A New Process Monitoring Framework and Its Application to Semiconductor Batch Processes
QP He, J Wang
AIChE Journal 57 (1), 107-121, 2011
Closed-loop subspace identification using the parity space
J Wang, SJ Qin
Automatica 42 (2), 315-320, 2006
Statistical process monitoring as a big data analytics tool for smart manufacturing
QP He, J Wang
Journal of Process Control 67, 35-43, 2018
Recursive Least Squares Estimation for Run-to-Run Control With Metrology Delay and Its Application to STI Etch Process
J Wang, QP He, SJ Qin, CA Bode, MA Purdy
IEEE Transactions on Semiconductor Manufacturing 18 (2), 309-319, 2005
A Reduced order soft sensor approach and its application to a continuous digester
HJ Galicia, QP He, J Wang
Journal of Process Control 21 (4), 489-500, 2011
Large-scale Semiconductor Process Fault Detection Using a Fast Pattern Recognition-Based Method
QP He, J Wang
IEEE Transactions on Semiconductor Manufacturing 23 (2), 194-200, 2010
Principal component based k-nearest-neighbor rule for semiconductor process fault detection
QP He, J Wang
2008 American Control Conference, 1606-1611, 2008
Comparison of variable selection methods for PLS-based soft sensor modeling
ZX Wang, QP He, J Wang
Journal of Process Control 26, 56-72, 2015
Discussion on: "Closed-Loop Identification of MIMO Systems: A New Look at Identifiability and Experiment Design''
J Wang
European Journal of Control 16 (3), 240-241, 2010
Comparison of the performance of a reduced-order dynamic PLS soft sensor with different updating schemes for digester control
HJ Galicia, QP He, J Wang
Control Engineering Practice 20 (8), 747-760, 2012
Probability constrained optimization for electrical fabrication control
RP Good, GA Cherry, J Wang
US Patent 6,959,224, 2005
Adjusting a sampling rate based on state estimation results
J Wang, BK Cusson
US Patent 6,766,214, 2004
A Bayesian Approach for Disturbance Detection and Classification and Its Application to State Estimation in Run-to-Run Control
J Wang, QP He
IEEE transactions on semiconductor manufacturing 20 (2), 126-136, 2007
State estimation of high-mix semiconductor manufacturing
J Wang, QP He, TF Edgar
Journal of Process Control 19 (3), 443-456, 2009
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