Jaehyun Lee
Title
Cited by
Cited by
Year
Analysis of drain-induced barrier rising in short-channel negative-capacitance FETs and its applications
J Seo, J Lee, M Shin
IEEE Transactions on Electron Devices 64 (4), 1793-1798, 2017
432017
Density functional theory based simulations of silicon nanowire field effect transistors
M Shin, WJ Jeong, J Lee
Journal of Applied Physics 119 (15), 154505, 2016
252016
p-Type Nanowire Schottky Barrier MOSFETs: Comparative Study of Ge-and Si-Channel Devices
W Choi, J Lee, M Shin
Electron Devices, IEEE Transactions on, 1-1, 2014
132014
NESS: New flexible nano-electronic simulation software
S Berrada, T Dutta, H Carrillo-Nunez, M Duan, F Adamu-Lema, J Lee, ...
2018 International Conference on Simulation of Semiconductor Processes and …, 2018
122018
A physics-based investigation of pt-salt doped carbon nanotubes for local interconnects
J Liang, R Ramos, J Dijon, H Okuno, D Kalita, D Renaud, J Lee, ...
2017 IEEE International Electron Devices Meeting (IEDM), 35.5. 1-35.5. 4, 2017
92017
Simulation of the impact of ionized impurity scattering on the total mobility in Si nanowire transistors
T Sadi, C Medina-Bailon, M Nedjalkov, J Lee, O Badami, S Berrada, ...
Materials 12 (1), 124, 2019
82019
Simulation study of germanium p-type nanowire Schottky barrier MOSFETs
J Lee, M Shin
IEEE electron device letters 34 (3), 342-344, 2013
72013
Investigation of Pt-salt-doped-standalone-multiwall carbon nanotubes for on-chip interconnect applications
J Liang, R Chen, R Ramos, J Lee, H Okuno, D Kalita, V Georgiev, ...
IEEE Transactions on Electron Devices 66 (5), 2346-2352, 2019
62019
Variability study of MWCNT local interconnects considering defects and contact resistances-Part I: pristine MWCNT
R Chen, J Liang, J Lee, VP Georgiev, R Ramos, H Okuno, D Kalita, ...
IEEE Transactions on Electron Devices, 2018
6*2018
Performance Assessment of III-V Channel Ultra-Thin-Body Schottky-Barrier MOSFETs
J Lee, M Shin
IEEE Electron Device Letter 35 (7), 726-728, 2014
62014
Understanding electromigration in Cu-CNT composite interconnects: A multiscale electrothermal simulation study
J Lee, S Berrada, F Adamu-Lema, N Nagy, VP Georgiev, T Sadi, J Liang, ...
IEEE Transactions on Electron Devices 65 (9), 3884-3892, 2018
52018
Progress on carbon nanotube BEOL interconnects
B Uhlig, J Liang, J Lee, R Ramos, A Dhavamani, N Nagy, J Dijon, ...
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 937-942, 2018
52018
The impact of vacancy defects on CNT interconnects: From statistical atomistic study to circuit simulations
J Lee, S Berrada, J Liang, T Sadi, VP Georgiev, A Todri-Sanial, D Kalita, ...
2017 International Conference on Simulation of Semiconductor Processes and …, 2017
52017
Effects of pH and ion concentration in a phosphate buffer solution on the sensitivity of silicon nanowire bioFETs
J Lee, M Shin, CG Ahn, CS Ah, CW Park, GY Sung, M Shin, CS Ah, ...
Journal of the Korean Physical Society 55 (4), 1621-1625, 2009
52009
Comprehensive study of cross-section dependent effective masses for silicon based gate-all-around transistors
O Badami, C Medina-Bailon, S Berrada, H Carrillo-Nunez, J Lee, ...
Applied Sciences 9 (9), 1895, 2019
42019
Investigation of inversion, accumulation and junctionless mode bulk Germanium FinFETs
V Thirunavukkarasu, J Lee, T Sadi, VP Georgiev, FA Lema, ...
Superlattices and Microstructures 111, 649-655, 2017
42017
Mobility of Circular and Elliptical Si Nanowire Transistors Using a Multi-Subband 1D Formalism
C Medina-Bailon, T Sadi, M Nedjalkov, H Carrillo-Nuñez, J Lee, ...
IEEE Electron Device Letters 40 (10), 1571-1574, 2019
32019
Variability Predictions for the Next Technology Generations of n-type SixGe1− x Nanowire MOSFETs
J Lee, O Badami, H Carrillo-Nuñez, S Berrada, C Medina-Bailon, T Dutta, ...
Micromachines 9 (12), 643, 2018
32018
Random Dopant-Induced Variability in Si-InAs Nanowire Tunnel FETs: A Quantum Transport Simulation Study
H Carrillo-Nuñez, J Lee, S Berrada, C Medina-Bailón, F Adamu-Lema, ...
IEEE Electron Device Letters 39 (9), 1473-1476, 2018
32018
Challenges and Progress on Carbon Nanotube Integration for BEOL Interconnects
B Uhlig, A Dhavamani, N Nagy, K Lilienthal, R Liske, R Ramos, J Dijon, ...
2018 IEEE International Interconnect Technology Conference (IITC), 16-18, 2018
32018
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