| Spurious exponentiality observed when incorrectly fitting a distribution to nonstationary data HE Ascher, CK Hansen IEEE transactions on reliability 47 (4), 451-459, 1998 | 68 | 1998 |
| Short-term electricity load forecasting with Time Series Analysis H Nguyen, CK Hansen 2017 IEEE International Conference on Prognostics and Health Management …, 2017 | 53 | 2017 |
| Use of wafer maps in integrated circuit manufacturing CK Hansen, P Thyregod Microelectronics Reliability 38 (6-8), 1155-1164, 1998 | 34 | 1998 |
| Heterogeneous part quality as a source of reliability improvement in repairable systems E Arjas, CK Hansen, P Thyregod Technometrics 33 (1), 1-12, 1991 | 29 | 1991 |
| Reliability prediction and simulation for a communications-satellite fleet CK Hansen Annual Reliability and Maintainability Symposium 1995 Proceedings, 152-158, 1995 | 13 | 1995 |
| Time management for department chairs CK Hansen John Wiley & Sons, 2011 | 12 | 2011 |
| Component lifetime models based on Weibull mixtures and competing risks CK Hansen, P Thyregod Quality and reliability engineering international 8 (4), 325-333, 1992 | 12 | 1992 |
| Modelling and estimation of wafer yields and defect densities from microelectronics test structure data CK Hansen, P Thyregod Quality and reliability engineering international 12 (1), 9-17, 1996 | 10 | 1996 |
| Effectiveness of yield-estimation and reliability-prediction based on wafer test-chip measurements CK Hansen Annual Reliability and Maintainability Symposium, 142-148, 1997 | 9 | 1997 |
| On the analysis of field failure data for repairable systems CK Hansen, P Thyregod Reliability Engineering & System Safety 36 (1), 47-51, 1992 | 9 | 1992 |
| Analysis of contaminated field failure data for repairable systems CK Hansen, P Thyregod Annual Reliability and Maintainability Symposium, 604-609, 1991 | 9 | 1991 |
| Estimation of the mean cumulative number of failures in a repairable system with mixed exponential component lifetimes CK Hansen, P Thyregod Quality and reliability engineering international 6 (5), 329-340, 1990 | 9 | 1990 |
| The Status of Reliability Engineering Technology 2001 CK Hansen Newsletter of the IEEE Reliability Society, 2001 | 8 | 2001 |
| Icphm'23 benchmark vibration dataset applicable in machine learning for systems' health monitoring N Enshaei, H Chen, F Naderkhani, J Lin, S Shahsafi, S Giliyana, ... In proceeding of IEEE Conference on Prognostics and Health Management (ICPHM), 2023 | 7 | 2023 |
| A prognostic model for managing consumer electricity demand and smart grid reliability CK Hansen 2012 IEEE Conference on Prognostics and Health Management, 1-6, 2012 | 7 | 2012 |
| Analysis of integrated circuit fault data using generalized linear models CK Hansen, P Thyregod Quality and Reliability Engineering International 16 (3), 173-185, 2000 | 7 | 2000 |
| Modeling repair events under intermittent failures and failures subject to unsuccessful repair CK Hansen, HE Ascher Quality and Reliability Engineering International 18 (6), 453-465, 2002 | 5 | 2002 |
| The status of reliability engineering technology 1999—a report to the IEEE Reliability Society CK Hansen, KP LaSala, S Keene, A Coppola Reliability Society Newsletter 45 (1), 10-14, 1999 | 5 | 1999 |
| Test structures for reliability assurance in spacecraft microelectronics SB Amor, G Gregoris, V Riviere, A Touboul, JL Stevenson, PS Yeung, ... Proceedings of the ESREF 93 Conference, 71-76, 1993 | 5 | 1993 |
| IEEE reliability society technical operations annual technical report for 2010 N Schneidewind, M Montrose, A Feinberg, A Ghazarian, J McLinn, ... IEEE Transactions on Reliability 59 (3), 449-482, 2010 | 4 | 2010 |
